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Castilla González, Elena María elena.castilla@urjc.es

Matemática Aplicada, Ciencia e Ingeniería de los Materiales y Tecnología Electrónica / Universidad Rey Juan Carlos

Publications

On Jensen-φ-divergence measure: Applications to logistic regression model and image processing

  • Kharazmi, Omid
  • Castilla, Elena
  • Yalcin, Femin

Computational & Applied Mathematics - 1/9/2025

10.1007/s40314-025-03278-9 View at source

  • ISSN 01018205

A new estimation approach based on phi-divergence measures for one-shot device accelerated life testing

  • Castilla, E

Quality And Reliability Engineering International (p. 2048-2066) - 1/6/2024

10.1002/qre.3507 View at source

  • ISSN 10991638

Robust inference for destructive one-shot device test data under Weibull lifetimes and competing risks

  • Balakrishnan, N
  • Castilla, E

Journal Of Computational And Applied Mathematics - 1/2/2024

10.1016/j.cam.2023.115452 View at source

  • ISSN 03770427

A new robust approach for the polytomous logistic regression model based on Rényi's pseudodistances

  • Castilla, E

Biometrics - 28/10/2024

10.1093/biomtc/ujae125 View at source

  • ISSN 0006341X

Robust estimation based on one-shot device test data under log-normal lifetimes

  • Balakrishnan, N
  • Castilla, E

Statistics (p. 1061-1086) - 3/9/2023

10.1080/02331888.2023.2240925 View at source

  • ISSN 02331888

Robust inference for nondestructive one-shot device testing under step-stress model with exponential lifetimes

  • Balakrishnan, N.
  • Castilla, E.
  • Jaenada, M.
  • Pardo, L.

Quality And Reliability Engineering International (p. 1192-1222) - 16/2/2023

Editor: John Wiley and Sons Ltd

10.1002/qre.3287 View at source

  • ISSN 10991638
  • ISSN/ISBN 1099-1638

Power divergence approach for one-shot device testing under competing risks

  • Balakrishnan, N
  • Castilla, E
  • Martin, N
  • Pardo, L

Journal Of Computational And Applied Mathematics - 1/2/2023

10.1016/j.cam.2022.114676 View at source

  • ISSN 03770427

Robust Minimum Divergence Estimation for the Multinomial Circular Logistic Regression Model

  • Castilla, Elena
  • Ghosh, Abhik

Entropy - 1/10/2023

10.3390/e25101422 View at source

  • ISSN 10994300

Robust Circular Logistic Regression Model and Its Application to Life and Social Sciences [Modelo de regresión logística circular robusto y su aplicación a las ciencias de la vida y sociales]

  • Castilla E

Revista Colombiana De Estadistica (p. 45-62) - 1/1/2023

10.15446/rce.v46n1.101517 View at source

  • ISSN 01201751

Estimation and Testing on Independent Not Identically Distributed Observations Based on Renyi's Pseudodistances

  • Castilla, E.
  • Jaenada, M.
  • Pardo, L.

Ieee Transactions On Information Theory (p. 4588-4609) - 1/7/2022

Editor: Institute of Electrical and Electronics Engineers Inc.

10.1109/tit.2022.3158308 View at source

  • ISSN 00189448
  • ISSN/ISBN 1557-9654

This researcher has no books.

Statistical Modeling and Robust Inference for One-shot Devices

  • Balakrishnan N
  • Castilla E

Statistical Modeling And Robust Inference For One-Shot Devices (p. 1-199) - 1/1/2025

10.1016/c2022-0-03026-9 View at source

On the Choice of the Optimal Tuning Parameter in Robust One-Shot Device Testing Analysis

  • Castilla E
  • Chocano PJ

Studies In Systems, Decision And Control (p. 169-180) - 1/1/2023

10.1007/978-3-031-04137-2_16 View at source

  • ISSN 21984190

A Logistic Regression Analysis Approach for Sample Survey Data Based on Phi-Divergence Measures

  • Castilla, Elena
  • Martin, Nirian
  • Pardo, Leandro

Studies In Systems, Decision And Control (p. 465-474) - 1/1/2018

10.1007/978-3-319-73848-2_43 View at source

  • ISSN 21984190

This researcher has no conferences.

This researcher has no working papers.

This researcher has no technical reports.

This researcher has no research projects.

This researcher has no supervised thesis.

This researcher has no patents or software licenses.

Last data update: 11/8/25 9:34 PM