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Castilla González, Elena María elena.castilla@urjc.es

Matemática Aplicada, Ciencia e Ingeniería de los Materiales y Tecnología Electrónica / Universidad Rey Juan Carlos

Publications

Robust inference for nondestructive one-shot device testing under step-stress model with exponential lifetimes

  • Balakrishnan, Narayanaswamy
  • Castilla, Elena
  • Jaenada, Maria
  • Pardo, Leandro;

Quality And Reliability Engineering International (p. 1192-1222) - 16/2/2023

10.1002/qre.3287 View at source

  • ISSN 10991638

Power divergence approach for one-shot device testing under competing risks

  • Balakrishnan N
  • Castilla E
  • Martin N
  • Pardo L

Journal Of Computational And Applied Mathematics - 1/2/2023

10.1016/j.cam.2022.114676 View at source

  • ISSN 03770427

Estimation and Testing on Independent Not Identically Distributed Observations Based on Renyi's Pseudodistances

  • Castilla, Elena
  • Jaenada, Maria
  • Pardo, Leandro;

Ieee Transactions On Information Theory (p. 4588-4609) - 1/7/2022

10.1109/tit.2022.3158308 View at source

  • ISSN 00189448

On distance-type Gaussian estimation

  • Castilla, Elena
  • Zografos, Konstantinos;

Journal Of Multivariate Analysis - 1/3/2022

10.1016/j.jmva.2021.104831 View at source

  • ISSN 0047259X

Robust approach for comparing two dependent normal populations through Wald-type tests based on Renyi's pseudodistance estimators

  • Castilla, Elena
  • Jaenada, Maria
  • Martin, Nirian
  • Pardo, Leandro;

Statistics And Computing - 1/12/2022

10.1007/s11222-022-10162-7 View at source

  • ISSN 09603174

A new robust approach for multinomial logistic regression with complex design model

  • Castilla E
  • Chocano PJ

Ieee Transactions On Information Theory (p. 1-1) - 1/11/2022

10.1109/tit.2022.3187063 View at source

  • ISSN 00189448

Optimal designs of constant-stress accelerated life-tests for one-shot devices with model misspecification analysis

  • Balakrishnan, Narayanaswamy
  • Castilla, Elena
  • Ling, Man Ho;

Quality And Reliability Engineering International (p. 989-1012) - 1/1/2022

10.1002/qre.3031 View at source

  • ISSN 10991638

EM-based likelihood inference for one-shot device test data under log-normal lifetimes and the optimal design of a CSALT plan

  • Balakrishnan, Narayanaswamy
  • Castilla, Elena;

Quality And Reliability Engineering International (p. 780-799) - 1/1/2022

10.1002/qre.3014 View at source

  • ISSN 10991638

Composite likelihood methods: Rao-type tests based on composite minimum density power divergence estimator

  • Castilla, E.
  • Martin, N.
  • Pardo, L.
  • Zografos, K.;

Statistical Papers (p. 1003-1041) - 1/4/2021

10.1007/s00362-019-01122-x View at source

  • ISSN 09325026

Divergence-Based Robust Inference Under Proportional Hazards Model for One-Shot Device Life-Test

  • Balakrishnan, Narayanaswamy
  • Castilla, Elena
  • Martin, Nirian
  • Pardo, Leandro;

Ieee Transactions On Reliability (p. 1355-1367) - 1/12/2021

10.1109/tr.2021.3062289 View at source

  • ISSN 00189529

This researcher has no books.

On the Choice of the Optimal Tuning Parameter in Robust One-Shot Device Testing Analysis

  • Castilla E
  • Chocano PJ

Studies In Systems, Decision And Control (p. 169-180) - 1/1/2023

10.1007/978-3-031-04137-2_16 View at source

  • ISSN 21984190

A Logistic Regression Analysis Approach for Sample Survey Data Based on Phi-Divergence Measures

  • Castilla, Elena
  • Martin, Nirian
  • Pardo, Leandro;

Studies In Systems, Decision And Control (p. 465-474) - 1/1/2018

10.1007/978-3-319-73848-2_43 View at source

  • ISSN 21984190

This researcher has no conferences.

This researcher has no working papers.

This researcher has no technical reports.

This researcher has no research projects.

This researcher has no supervised thesis.

This researcher has no patents or software licenses.

Last data update: 7/14/23 2:02 PM