RDF/XML JSON-LD N3/Turtle RDF/JSON

Castilla González, Elena María elena.castilla@urjc.es

Matemática Aplicada, Ciencia e Ingeniería de los Materiales y Tecnología Electrónica / Universidad Rey Juan Carlos

Publications

Reliability Analysis of Limited Failure One-Shot Devices

  • Balakrishnan
  • N
  • Castilla
  • E

Ieee Transactions On Reliability (p. 157-170) - 1/1/2026

10.1109/tr.2025.3635002 View at source

  • ISSN 00189529

On Jensen-φ-divergence measure: Applications to logistic regression model and image processing

  • Kharazmi, O
  • Castilla, E
  • Yalcin, F

Computational & Applied Mathematics - 1/9/2025

10.1007/s40314-025-03278-9 View at source

  • ISSN 01018205

Robust inference and model selection for data from one-shot devices under cyclic accelerated life-tests with an application to a test of CSP solder joints

  • Balakrishnan, N
  • Castilla, E

Proceedings Of The Institution Of Mechanical Engineers Part O-Journal Of Risk And Reliability (p. 900-914) - 1/10/2025

10.1177/1748006x251314506 View at source

  • ISSN 1748006X

Parametric estimation and robust inference for current status data with Lindley lifetimes

  • Castilla
  • E

Communications In Statistics-Simulation And Computation - 21/1/2025

10.1080/03610918.2025.2455415 View at source

  • ISSN 15324141

Reflections of a researcher in her early career; Reflexiones de una investigadora en sus primeros años de carrera

  • Castilla
  • E

Boletin De Estadistica E Investigacion Operativa (p. 72-73) - 1/1/2025

  • iMarina

A new estimation approach based on phi-divergence measures for one-shot device accelerated life testing

  • Castilla, E

Quality And Reliability Engineering International (p. 2048-2066) - 1/6/2024

10.1002/qre.3507 View at source

  • ISSN 10991638

Robust inference for destructive one-shot device test data under Weibull lifetimes and competing risks

  • Balakrishnan, N
  • Castilla, E

Journal Of Computational And Applied Mathematics - 1/2/2024

10.1016/j.cam.2023.115452 View at source

  • ISSN 03770427

A new robust approach for the polytomous logistic regression model based on Rényi's pseudodistances

  • Castilla, E

Biometrics - 28/10/2024

10.1093/biomtc/ujae125 View at source

  • ISSN 0006341X

Robust estimation based on one-shot device test data under log-normal lifetimes

  • Balakrishnan, N
  • Castilla, E

Statistics (p. 1061-1086) - 3/9/2023

10.1080/02331888.2023.2240925 View at source

  • ISSN 02331888

Robust inference for nondestructive one-shot device testing under step-stress model with exponential lifetimes

  • Balakrishnan, N
  • Castilla, E
  • Jaenada, M
  • Pardo, L

Quality And Reliability Engineering International (p. 1192-1222) - 16/2/2023

Editor: John Wiley and Sons Ltd

10.1002/qre.3287 View at source

  • ISSN 10991638
  • ISSN/ISBN 1099-1638

This researcher has no books.

Statistical Modeling and Robust Inference for One-shot Devices

  • Balakrishnan N
  • Castilla E

Statistical Modeling And Robust Inference For One-Shot Devices (p. 1-199) - 1/1/2025

10.1016/c2022-0-03026-9 View at source

On the Choice of the Optimal Tuning Parameter in Robust One-Shot Device Testing Analysis

  • Castilla E
  • Chocano PJ

Studies In Systems, Decision And Control (p. 169-180) - 1/1/2023

10.1007/978-3-031-04137-2_16 View at source

  • ISSN 21984190

A Logistic Regression Analysis Approach for Sample Survey Data Based on Phi-Divergence Measures

  • Castilla, Elena
  • Martin, Nirian
  • Pardo, Leandro

Studies In Systems, Decision And Control (p. 465-474) - 1/1/2018

10.1007/978-3-319-73848-2_43 View at source

  • ISSN 21984190

This researcher has no conferences.

This researcher has no working papers.

This researcher has no technical reports.

Inferencia Robusta para Modelos de Cura Mixtos basada en Medidas de Divergencia.

  • Castilla González, Elena María (Investigador principal (IP))

Period: 01-01-2026 - 31-12-2026

  • iMarina

This researcher has no supervised thesis.

This researcher has no patents or software licenses.

Last data update: 2/15/26 1:42 PM