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Castilla González, Elena María elena.castilla@urjc.es

Matemática Aplicada, Ciencia e Ingeniería de los Materiales y Tecnología Electrónica / Universidad Rey Juan Carlos

Actividades

Reliability Analysis of Limited Failure One-Shot Devices

  • Balakrishnan
  • N
  • Castilla
  • E

Ieee Transactions On Reliability (p. 157-170) - 1/1/2026

10.1109/tr.2025.3635002 Ver en origen

  • ISSN 00189529

On Jensen-φ-divergence measure: Applications to logistic regression model and image processing

  • Kharazmi, O
  • Castilla, E
  • Yalcin, F

Computational & Applied Mathematics - 1/9/2025

10.1007/s40314-025-03278-9 Ver en origen

  • ISSN 01018205

Robust inference and model selection for data from one-shot devices under cyclic accelerated life-tests with an application to a test of CSP solder joints

  • Balakrishnan, N
  • Castilla, E

Proceedings Of The Institution Of Mechanical Engineers Part O-Journal Of Risk And Reliability (p. 900-914) - 1/10/2025

10.1177/1748006x251314506 Ver en origen

  • ISSN 1748006X

Parametric estimation and robust inference for current status data with Lindley lifetimes

  • Castilla
  • E

Communications In Statistics-Simulation And Computation - 21/1/2025

10.1080/03610918.2025.2455415 Ver en origen

  • ISSN 15324141

Reflections of a researcher in her early career; Reflexiones de una investigadora en sus primeros años de carrera

  • Castilla
  • E

Boletin De Estadistica E Investigacion Operativa (p. 72-73) - 1/1/2025

  • iMarina

A new estimation approach based on phi-divergence measures for one-shot device accelerated life testing

  • Castilla, E

Quality And Reliability Engineering International (p. 2048-2066) - 1/6/2024

10.1002/qre.3507 Ver en origen

  • ISSN 10991638

Robust inference for destructive one-shot device test data under Weibull lifetimes and competing risks

  • Balakrishnan, N
  • Castilla, E

Journal Of Computational And Applied Mathematics - 1/2/2024

10.1016/j.cam.2023.115452 Ver en origen

  • ISSN 03770427

A new robust approach for the polytomous logistic regression model based on Rényi's pseudodistances

  • Castilla, E

Biometrics - 28/10/2024

10.1093/biomtc/ujae125 Ver en origen

  • ISSN 0006341X

Robust estimation based on one-shot device test data under log-normal lifetimes

  • Balakrishnan, N
  • Castilla, E

Statistics (p. 1061-1086) - 3/9/2023

10.1080/02331888.2023.2240925 Ver en origen

  • ISSN 02331888

Robust inference for nondestructive one-shot device testing under step-stress model with exponential lifetimes

  • Balakrishnan, N
  • Castilla, E
  • Jaenada, M
  • Pardo, L

Quality And Reliability Engineering International (p. 1192-1222) - 16/2/2023

Editor: John Wiley and Sons Ltd

10.1002/qre.3287 Ver en origen

  • ISSN 10991638
  • ISSN/ISBN 1099-1638

Este/a investigador/a no tiene libros.

Statistical Modeling and Robust Inference for One-shot Devices

  • Balakrishnan N
  • Castilla E

Statistical Modeling And Robust Inference For One-Shot Devices (p. 1-199) - 1/1/2025

10.1016/c2022-0-03026-9 Ver en origen

On the Choice of the Optimal Tuning Parameter in Robust One-Shot Device Testing Analysis

  • Castilla E
  • Chocano PJ

Studies In Systems, Decision And Control (p. 169-180) - 1/1/2023

10.1007/978-3-031-04137-2_16 Ver en origen

  • ISSN 21984190

A Logistic Regression Analysis Approach for Sample Survey Data Based on Phi-Divergence Measures

  • Castilla, Elena
  • Martin, Nirian
  • Pardo, Leandro

Studies In Systems, Decision And Control (p. 465-474) - 1/1/2018

10.1007/978-3-319-73848-2_43 Ver en origen

  • ISSN 21984190

Este/a investigador/a no tiene congresos.

Este/a investigador/a no tiene documentos de trabajo.

Este/a investigador/a no tiene informes técnicos.

Inferencia Robusta para Modelos de Cura Mixtos basada en Medidas de Divergencia.

  • Castilla González, Elena María (Investigador principal (IP))

Ejecución: 01-01-2026 - 31-12-2026

  • iMarina

Este/a investigador/a no tiene tesis dirigidas.

Este/a investigador/a no tiene patentes o licencias de software.

Última actualización de los datos: 15/02/26 13:42