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Castilla González, Elena María elena.castilla@urjc.es

Matemática Aplicada, Ciencia e Ingeniería de los Materiales y Tecnología Electrónica / Universidad Rey Juan Carlos

Actividades

Robust inference for nondestructive one-shot device testing under step-stress model with exponential lifetimes

  • Balakrishnan, Narayanaswamy
  • Castilla, Elena
  • Jaenada, Maria
  • Pardo, Leandro;

Quality And Reliability Engineering International (p. 1192-1222) - 16/2/2023

10.1002/qre.3287 Ver en origen

  • ISSN 10991638

Power divergence approach for one-shot device testing under competing risks

  • Balakrishnan N
  • Castilla E
  • Martin N
  • Pardo L

Journal Of Computational And Applied Mathematics - 1/2/2023

10.1016/j.cam.2022.114676 Ver en origen

  • ISSN 03770427

Estimation and Testing on Independent Not Identically Distributed Observations Based on Renyi's Pseudodistances

  • Castilla, Elena
  • Jaenada, Maria
  • Pardo, Leandro;

Ieee Transactions On Information Theory (p. 4588-4609) - 1/7/2022

10.1109/tit.2022.3158308 Ver en origen

  • ISSN 00189448

On distance-type Gaussian estimation

  • Castilla, Elena
  • Zografos, Konstantinos;

Journal Of Multivariate Analysis - 1/3/2022

10.1016/j.jmva.2021.104831 Ver en origen

  • ISSN 0047259X

Robust approach for comparing two dependent normal populations through Wald-type tests based on Renyi's pseudodistance estimators

  • Castilla, Elena
  • Jaenada, Maria
  • Martin, Nirian
  • Pardo, Leandro;

Statistics And Computing - 1/12/2022

10.1007/s11222-022-10162-7 Ver en origen

  • ISSN 09603174

A new robust approach for multinomial logistic regression with complex design model

  • Castilla E
  • Chocano PJ

Ieee Transactions On Information Theory (p. 1-1) - 1/11/2022

10.1109/tit.2022.3187063 Ver en origen

  • ISSN 00189448

Optimal designs of constant-stress accelerated life-tests for one-shot devices with model misspecification analysis

  • Balakrishnan, Narayanaswamy
  • Castilla, Elena
  • Ling, Man Ho;

Quality And Reliability Engineering International (p. 989-1012) - 1/1/2022

10.1002/qre.3031 Ver en origen

  • ISSN 10991638

EM-based likelihood inference for one-shot device test data under log-normal lifetimes and the optimal design of a CSALT plan

  • Balakrishnan, Narayanaswamy
  • Castilla, Elena;

Quality And Reliability Engineering International (p. 780-799) - 1/1/2022

10.1002/qre.3014 Ver en origen

  • ISSN 10991638

Composite likelihood methods: Rao-type tests based on composite minimum density power divergence estimator

  • Castilla, E.
  • Martin, N.
  • Pardo, L.
  • Zografos, K.;

Statistical Papers (p. 1003-1041) - 1/4/2021

10.1007/s00362-019-01122-x Ver en origen

  • ISSN 09325026

Divergence-Based Robust Inference Under Proportional Hazards Model for One-Shot Device Life-Test

  • Balakrishnan, Narayanaswamy
  • Castilla, Elena
  • Martin, Nirian
  • Pardo, Leandro;

Ieee Transactions On Reliability (p. 1355-1367) - 1/12/2021

10.1109/tr.2021.3062289 Ver en origen

  • ISSN 00189529

Este/a investigador/a no tiene libros.

On the Choice of the Optimal Tuning Parameter in Robust One-Shot Device Testing Analysis

  • Castilla E
  • Chocano PJ

Studies In Systems, Decision And Control (p. 169-180) - 1/1/2023

10.1007/978-3-031-04137-2_16 Ver en origen

  • ISSN 21984190

A Logistic Regression Analysis Approach for Sample Survey Data Based on Phi-Divergence Measures

  • Castilla, Elena
  • Martin, Nirian
  • Pardo, Leandro;

Studies In Systems, Decision And Control (p. 465-474) - 1/1/2018

10.1007/978-3-319-73848-2_43 Ver en origen

  • ISSN 21984190

Este/a investigador/a no tiene congresos.

Este/a investigador/a no tiene documentos de trabajo.

Este/a investigador/a no tiene informes técnicos.

Este/a investigador/a no tiene proyectos de investigación.

Este/a investigador/a no tiene tesis dirigidas.

Este/a investigador/a no tiene patentes o licencias de software.

Última actualización de los datos: 14/07/23 14:02