Feijoo Guerro, Pedro Carlos pc.feijoo@upm.es
Actividades
- Artículos 24
- Libros 0
- Capítulos de libro 0
- Congresos 44
- Documentos de trabajo 0
- Informes técnicos 0
- Proyectos de investigación 12
- Tesis dirigidas 0
- Patentes o licencias de software 0
2D pn junctions driven out-of-equilibrium
- Chaves FA
- Feijoo PC
- Jiménez D
Nanoscale Advances (p. 3252-3262) - 1/8/2020
10.1039/d0na00267d Ver en origen
- ISSN 25160230
An Extraction Method for Mobility Degradation and Contact Resistance of Graphene Transistors
- Pacheco-Sanchez A
- Mavredakis N
- Feijoo PC
- Jimenez D
Ieee Transactions On Electron Devices (p. 4037-4041) - 1/7/2022
10.1109/ted.2022.3176830 Ver en origen
- ISSN 00189383
Anomalous thermal oxidation of gadolinium thin films deposited on silicon by high pressure sputtering
- Pampillon, M. A.
- Feijoo, P. C.
- San Andres, E.
- Lucia, M. L.
- del Prado, A.
- Toledano-Luque, M.;
Microelectronic Engineering (p. 2991-2996) - 1/9/2011
10.1016/j.mee.2011.04.058 Ver en origen
- ISSN 01679317
Compact Modeling Technology for the Simulation of Integrated Circuits Based on Graphene Field-Effect Transistors
- Pasadas F
- Feijoo PC
- Mavredakis N
- Pacheco-Sanchez A
- Chaves FA
- Jiménez D
Advanced Materials - 1/12/2022
10.1002/adma.202201691 Ver en origen
- ISSN 09359648
Contact resistance extraction of graphene FET technologies based on individual device characterization
- Pacheco-Sanchez A
- Feijoo PC
- Jiménez D
Solid-State Electronics - 1/10/2020
10.1016/j.sse.2020.107882 Ver en origen
- ISSN 00381101
Does carrier velocity saturation help to enhance: F maxin graphene field-effect transistors?
- Feijoo PC
- Pasadas F
- Bonmann M
- Asad M
- Yang X
- Generalov A
- Vorobiev A
- Banszerus L
- Stampfer C
- Otto M
- Neumaier D
- Stake J
- Jiménez D
Nanoscale Advances (p. 4179-4186) - 1/9/2020
10.1039/c9na00733d Ver en origen
- ISSN 25160230
Electrical characterization of high-pressure reactive sputtered ScO x films on silicon
- LUIS BAILON
- HELENA CASTAN
- SALVADOR DUEÑAS
- PEDRO CARLOS FEIJOO GUERRO
- HECTOR GARCIA
- ALFONSO GOMEZ
- MARIA LUISA LUCIA MULAS
- ALVARO DEL PRADO MILLAN
- ENRIQUE SAN ANDRES SERRANO
- MARIA TOLEDANO LUQUE
Thin Solid Films (p. 2268-2272) - 31/1/2011
10.1016/j.tsf.2010.10.073 Ver en origen
- ISSN 00406090
- iMarina
- iMarina
Experimental Observation and Modeling of the Impact of Traps on Static and Analog/HF Performance of Graphene Transistors
Ieee Transactions On Electron Devices (p. 5790-5796) - 1/12/2020
10.1109/ted.2020.3029542 Ver en origen
- ISSN 00189383
Gadolinium scandate by high-pressure sputtering for future generations of high-kappa dielectrics
- Feijoo, P. C.
- Pampillon, M. A.
- Andres, E. San
- Fierro, J. L. G.;
Semiconductor Science And Technology - 1/8/2013
10.1088/0268-1242/28/8/085004 Ver en origen
- ISSN 13616641
High pressure sputtering as a viable technique for future high permittivity dielectric on III-V integration: GdOx on InP demonstration
- Angela Pampillon, Maria
- Canadilla, Carmina
- Carlos Feijoo, Pedro
- San Andres, Enrique
- del Prado, Alvaro;
Journal Of Vacuum Science And Technology B: Nanotechnology And Microelectronics - 1/1/2013
10.1116/1.4771970 Ver en origen
- ISSN 21662746
Este/a investigador/a no tiene libros.
Este/a investigador/a no tiene capítulos de libro.
A Drift-Diffusion Graphene Field Effect Transistor model to study scaling effects on High Frequency performance
- Pedro C Feijoo Guerro
- David Jiménez Jiménez
- Xavier Cartoixà
19/4/2016
- iMarina
Analysis of traps-related effects hindering GFETs performance
- N Mavredakis
- A Pacheco-Sánchez
- PC Feijoo
- D Jiménez
Proceedings Of The 2021 13th Spanish Conference On Electron Devices, Cde 2021 (p. 78-81) - 9/6/2021
10.1109/cde52135.2021.9455722 Ver en origen
- iMarina
- iMarina
Channel Length Scaling of Graphene Field-Effect Transistors targeting Radio Frequency Applications
- Pedro Carlos Feijoo Guerro
- Xavier Cartoixà Soler
- David Jiménez Jiménez
10/3/2015
- iMarina
Drain current saturation in graphene field-effect transistors at high fields
- Marlene Bonmann
- Andrei Vorobiev
- Xinxin Yang
- Muhammad Asad
- Jan Stake
- Luca Banszerus
- Christoph Stampfer
- Martin Otto
- Daniel Neumaier
- Pedro Carlos Feijoo Guerro
- Francisco Pasadas Cantos
- David Jiménez Jiménez
10/9/2018
- iMarina
Electrical and chemical characterization of high pressure sputtered scandium oxide for memory applications
- PEDRO CARLOS FEIJOO GUERRO
- JOSE LUIS GARCIA FIERRO
- MARIA LUISA LUCIA MULAS
- ALVARO DEL PRADO MILLAN
- ENRIQUE SAN ANDRES SERRANO
- MARIA TOLEDANO LUQUE
Proceedings Of The 8th Spanish Conference On Electron Devices, Cde'2011 - 12/5/2011
10.1109/sced.2011.5744185 Ver en origen
- iMarina
- iMarina
Electrical characterization of gadolinium oxide deposited by high pressure sputtering with in situ plasma oxidation
- Angela Pampillon, Maria
- Carlos Feijoo, Pedro
- San Andres, Enrique;
Microelectronic Engineering (p. 236-239) - 25/6/2013
10.1016/j.mee.2013.03.094 Ver en origen
- ISSN 01679317
- iMarina
- iMarina
Electrical characterization of high-pressure reactive sputtered Sc 2O3 films on silicon
- Castán H
- Dueñas S
- Gómez A
- García H
- Bailón L
- Feijoo PC
- Toledano-Luque M
- Del Prado A
- San Andrés E
- Lucía ML
Ecs Transactions (p. 287-297) - 1/1/2010
10.1149/1.3375614 Ver en origen
- ISSN 19386737
Electrical study of ScO-based MIS structures using Al and Ti as gate electrodes
- LUIS A BAILON VEGA
- HELENA CASTAN LANASPA
- SALVADOR DUEÑAS CARAZO
- PEDRO CARLOS FEIJOO GUERRO
- HECTOR GARCIA GARCIA
- MARIA ANGELA PAMPILLON ARCE
- ENRIQUE SAN ANDRES SERRANO
9th Spanish Conference On Electron Devices, Cde 2013 (p. 285-288) - 8/4/2013
10.1109/cde.2013.6481398 Ver en origen
- ISSN 9781467346689
- iMarina
- iMarina
Electrical study of ScO-based MIS structures using Al and Ti as gate electrodes
- Garcia, H.
- Castan, H.
- Duenas, S.
- Bailon, L.
- Feijoo, P. C.
- Pampillon, M. A.
- San Andres, E.;
Proceedings Of The 2013 Spanish Conference On Electron Devices (Cde 2013) (p. 285-288) - 1/1/2013
- ISSN 21634971
- iMarina
Este/a investigador/a no tiene documentos de trabajo.
Este/a investigador/a no tiene informes técnicos.
RIS3CAT – Comunitats Emergents
- David Jiménez Jiménez (Investigador principal (IP))
- FEIJOO GUERRO, PEDRO CARLOS (Investigador/a)
Ejecución: 01-06-2018 - 30-06-2021
Importe financiado: 175000,00 Euros.
- iMarina
Transporte de electrones y fonones en nanodispositivos para aplicaciones de bajo y cero consumo (ELEPHONT)
- Xavier Cartoixà Soler
- Xavier Oriols Pladevall (Investigador principal (IP))
- FEIJOO GUERRO, PEDRO CARLOS (Investigador/a)
Ejecución: 01-01-2016 - 31-12-2018
Tipo: Nacional
Importe financiado: 116900,00 Euros.
- iMarina
Este/a investigador/a no tiene tesis dirigidas.
Este/a investigador/a no tiene patentes o licencias de software.
Grupos de investigación
-
Teoría de Aproximación Constructiva y Aplicaciones
Rol: Miembro
Perfiles de investigador/a
-
ORCID
-
Scopus Author ID