Vazquez Lopez, Manuel manuel.vazquez@upm.es
Publications
- Articles 29
- Books 0
- Book chapters 1
- Conferences 34
- Working papers 0
- Technical reports 0
- Research projects 23
- Supervised theses 3
- Patent or software license 1
High-power UV-LED degradation: Continuous and cycled working condition influence
- Arques-Orobon F
- Nuñez N
- Vazquez M
- Segura-Antunez C
- González-Posadas V
Solid-State Electronics (p. 111-117) - 13/6/2015
10.1016/j.sse.2015.05.039 View at source
- ISSN 00381101
Estimation of activation energy and reliability figures of space lattice-matched GaInP/Ga(In)As/Ge triple junction solar cells from Temperature Accelerated Life Tests
- Nuñez, N
- Vazquez, M
- Barrutia, L
- Bautista, J
- Lombardero, I
- Zamorano, JC
- Hinojosa, M
- Gabas, M
- Algora, C
Solar Energy Materials And Solar Cells - 1/1/2021
10.1016/j.solmat.2021.111211 View at source
- ISSN 09270248
Estimation of the reliability figures of space GaInP/Ga(In)As/Ge triple junction solar cells from very high temperature accelerated life tests with forward and reverse biasing
- Nuñez, N
- Vazquez, M
- Martín, P
- Bautista, J
- Hinojosa, M
- Algora, C
Solar Energy Materials And Solar Cells - 15/8/2023
10.1016/j.solmat.2023.112454 View at source
- ISSN 09270248
Functional analysis in long-term operation of high power UV-LEDS in continuous fluoro-sensing systems for hydrocarbon pollution
- Arques-Orobon F
- Nuñez N
- Vazquez M
- Gonzalez-Posadas V
Sensors - 26/2/2016
10.3390/s16030293 View at source
- ISSN 14248220
Instrumentation for accelerated life tests of concentrator solar cells
- Núñez N
- Vázquez M
- González J
- Jiménez F
- Bautista J
Review Of Scientific Instruments - 1/1/2011
10.1063/1.3541800 View at source
- ISSN 00346748
Temperature Accelerated Life Test and Failure Analysis on Upright Metamorphic Ga0.37In0.63P/Ga0.83In0.17As/Ge Triple Junction Solar Cells
- Orlando, V
- Lombardero, I
- Gabás, M
- Nuñez, N
- Vázquez, M
- Espinet-González, P
- Bautista, J
- Romero, R
- Algora, C
Progress In Photovoltaics (p. 148-166) - 1/2/2020
10.1002/pip.3223 View at source
- ISSN 10627995
Failure analysis on lattice matched GaInP/Ga(In)As/Ge commercial concentrator solar cells after temperature accelerated life tests
- Orlando, V
- Gabás, M
- Galiana, B
- Espinet-González, P
- Palanco, S
- Nuñez, N
- Vázquez, M
- Araki, K
- Algora, C
Progress In Photovoltaics (p. 97-112) - 1/1/2017
10.1002/pip.2818 View at source
- EISSN 1099-159X
- ISSN 10627995
Temperature accelerated life test on commercial concentrator III-V triple-junction solar cells and reliability analysis as a function of the operating temperature
Progress In Photovoltaics (p. 559-569) - 1/5/2015
10.1002/pip.2461 View at source
- ISSN 10627995
Reliability of commercial triple junction concentrator solar cells under real climatic conditions and its influence on electricity cost
- Vazquez M
- Tamayo-Arriola J
- Orlando V
- Nuñez N
- Alburquerque O
- Algora C
Progress In Photovoltaics (p. 905-918) - 1/11/2017
10.1002/pip.2902 View at source
- ISSN 10627995
Semi-quantitative temperature accelerated life test (ALT) for the reliability qualification of concentrator solar cells and cell on carriers
- Nuñez N
- Vazquez M
- Orlando V
- Espinet-González P
- Algora C
Progress In Photovoltaics (p. 1857-1866) - 1/12/2015
10.1002/pip.2631 View at source
- ISSN 10627995
This researcher has no books.
Reliability
- Algora C
- Espinet-González P
- Vazquez M
- Bosco N
- Miller D
- Kurtz S
- Rubio F
- Mcconnell R
Handbook Of Concentrator Photovoltaic Technology (p. 521-588) - 8/4/2016
10.1002/9781118755655.ch09 View at source
- iMarina
- iMarina
III-V high concentrator solar cells: assessing the reliability of a new product
- José Ramón González Ciprián
- Carlos Algora Del Valle
- Ignacio Rey-Stolle Prado
- Manuel Vázquez
- Neftalí Nuñez
- Beatriz Galiana Blanco
- Iván García Vara
- Juán Barbero
- Vicente Díaz Luque
(p. 9-12) - 12/3/2007
- iMarina
Análisis de fiabilidad de componentes electrónicos basados en los modelos de degradación
- Eduardo Nogueira
- David Rodríguez
- Vazquez Lopez, Manuel
28/11/2007
- iMarina
Reliability evaluation of III-V Concentrator solar cells
- José R. González
- Nuñez Mendoza, Neftali
- Rey-Stolle Prado, Ignacio
- Algora del Valle, Carlos
- Vazquez Lopez, Manuel
Safety, Reliability And Risk Analysis: Theory, Methods And Applications - Proceedings Of The Joint Esrel And Sra-Europe Conference (p. 1949-1953) - 1/12/2009
- ISSN 00010782
- iMarina
Evaluation of the reliability of space solar cells by means of Sequential Accelerated Life Tests
- Manuel Vázquez
- Neftalí Nuñez
- Carlos Algora
Proceedings (p. 0-6) - 30/9/2019
10.1109/espc.2019.8931981 View at source
- iMarina
- iMarina
Sistema de Instrumentación de Ensayos Acelerados para Evaluar la Fiabilidad de Dispositivos Semiconductores III-V a Partir de Datos de Degradación
- J.R. González
- E. Pérez
- Nuñez Mendoza, Neftali
- Algora del Valle, Carlos
- Vazquez Lopez, Manuel
Proceedings (p. 1-12) - 3/6/2009
- iMarina
Innovative Temperature Accelerated Life Test for the determination of the activation energy of space solar cells
- Nuñez, N
- Vazquez, M
- Barrutia, L
- Bautista, J
- Lombardero, I
- Zamorano, JC
- Hinojosa, M
- Gabas, M
- Algora, C
Proceedings (p. 0-6) - 30/9/2019
10.1109/espc.2019.8931993 View at source
- iMarina
- iMarina
Degradation mechanism analysis in temperature stress tests on III-V ultra-high concentrator solar cells using a 3D distributed model
- Espinet P
- Algora C
- González J
- Núnez N
- Vázquez M
Microelectronics Reliability (p. 1875-1879) - 1/1/2010
10.1016/j.microrel.2010.07.128 View at source
- ISSN 00262714
Degradation of AlInGaP red LEDs under drive current and temperature accelerated life tests
- Vázquez M
- Núñez N
- Nogueira E
- Borreguero A
Microelectronics Reliability (p. 1559-1562) - 1/1/2010
10.1016/j.microrel.2010.07.057 View at source
- ISSN 00262714
UV LEDs reliability tests for fluoro-sensing sensor application
- Arques-Orobon F
- Nuñez N
- Vazquez M
- González-Posadas V
Microelectronics Reliability (p. 2154-2158) - 1/9/2014
10.1016/j.microrel.2014.07.059 View at source
- ISSN 00262714
Novel accelerated testing method for III-V concentrator solar cells
- Núñez N
- Vázquez M
- González J
- Algora C
- Espinet P
Microelectronics Reliability (p. 1880-1883) - 1/1/2010
10.1016/j.microrel.2010.07.085 View at source
- ISSN 00262714
This researcher has no working papers.
This researcher has no technical reports.
REALIZACIÓN DE LOS CÁLCULOS DE LOS MTBF Y MTBO DEL EQUIPO RCSU BASADOS EN DATOS DE FIABILIDAD DISPONIBLES DE FABRICANTES DE EQUIPOS Y COMPONENTES, CUANDO SEA POSIBLE DISPONER DE LOS MISMOS Y EN MIL-HDBK-L217F NOTICE2
- Vazquez Lopez, Manuel (Investigador principal (IP))
Period: 27-10-2010 - 25-10-2016
Type of funding: Internal
- iMarina
Células Solares de Triple Unión con Eficiencias Cercanas al 40% a 1000 Soles
- Carlos Algora del Valle (Investigador principal (IP))
- CORREGIDOR BERDASCO, VICTORIA (Participante)
- ALGORA VALLE, CARLOS (Participante)
- DATAS MEDINA, ALEJANDRO (Participante)
- García Vara, Iván (Participante)
- Nuñez Mendoza, Neftali (Participante)
- Vazquez Lopez, Manuel (Investigador principal (IP))
Period: 01-01-2009 - 31-12-2011
Type of funding: National
- iMarina
S-0505/ENE/0310 - Nueva generación de materiales dispositivos y estrategias fotovoltaicas para un mejor aprovechamiento de la energía del Sol
- CASTRILLO MASCAREÑAS, RICARDO (Investigador principal (IP))
- LUQUE LOPEZ, Antonio (Investigador principal (IP))
Period: 01-12-2005 - 01-01-2010
Type of funding: Regional
Funding entity: CAM. CONSEJERÍA DE EDUCACIÓN E INVESTIGACION
Amount of funding: 57059,00 Euros.
- iMarina
- UC3M
Análisis de fiabilidad de leds de AlInGaP de alta eficiencia luminosa
- Vazquez Lopez, Manuel (Director)
- Nuñez Mendoza, Neftali (Director) Doctorando: Nogueira Díaz, Eduardo
1/10/2013
- iMarina
Ensayos acelerados de fiabilidad de células solares de concentración
- Vazquez Lopez, Manuel (Director) Doctorando: Nuñez Mendoza, Neftali
12/3/2012
- iMarina
Research groups
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Semiconductores III-V
Role: Miembro
Researcher profiles
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ORCID
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Publons
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Scopus Author ID