AES AND FACTOR-ANALYSIS STUDY OF THE INTERACTION OF OXYGEN WITH TANTALUMAND TANTALUM NITRIDE THIN-FILMS

Vacuum (p. 1091-1093) - 1/1/1994

10.1016/0042-207x(94)90031-0 Ver en origen

• ISSN 0042207X

• iMarina

A study of the interface formation and initial oxidation in the Ti-Si system

(p. 276-279) - 1/1/1996

• iMarina

Characterization of the surface and interface species formed during theoxidation of aluminum

Surface Science (p. 203-213) - 1/6/1996

10.1016/0039-6028(96)01056-4 Ver en origen

• ISSN 00396028

• iMarina

Spectroscopic characterization of the surface nanostructure of Ti duringdeposition on polycrystalline aluminium

Surface And Interface Analysis (p. 871-879) - 1/1/1999

10.1002/(sici)1096-9918(199909)27:9<871::aid-sia654>3.3.co;2-l Ver en origen

• ISSN 01422421

• iMarina

Iron deposition on polycrystalline aluminium: composition andnanostructure of the interface

Surface And Interface Analysis (p. 392-398) - 1/1/2000

10.1002/1096-9918(200006)29:6<392::aid-sia883>3.0.co;2-8 Ver en origen

• ISSN 01422421

• iMarina

Electronic structure and interface formation during nickel deposition onpolycrystalline aluminum

J Phys Chem b (p. 9647-9652) - 1/1/2000

10.1021/jp001097e Ver en origen

• ISSN 10895647

• iMarina

Tantalum nitride formation by low-energy (0.5-5 keV) nitrogenimplantation

Surface And Interface Analysis (p. 653-658) - 1/10/2000

10.1002/1096-9918(200010)29:10<653::aid-sia913>3.0.co;2-t Ver en origen

• ISSN 01422421

• iMarina

Electronic structure and interface formation during nickel deposition on polycrystalline aluminum

Journal Of Physical Chemistry b (p. 9647-9652) - 19/10/2000

• ISSN 15206106

• iMarina

Oxidation of iron deposited on polycrystalline aluminum surfaces

J Phys Chem b (p. 10805-10811) - 8/11/2001

10.1021/jp010531p Ver en origen

• ISSN 10895647

• iMarina

Quantum-well states in ultrathin Ag(111) films deposited ontoH-passivated Si(111)-(1x1) surfaces

Physical Review b (p. 1-7) - 1/1/2002

10.1103/physrevb.65.195410 Ver en origen

• ISSN 01631829

• iMarina

Espectroscopía Auger (AES).

Ii Curso De Ciencia E Ingeniería De La Superficie De Los Materiales Metálicos. Cenim/Csic. (p. 469-479) - 1/1/1996

• iMarina

Espectroscopía de electrones Auger.

Ciencia E Ingeniería De La Superficie De Los Materiales Metálicos. Colección Textos Universitarios, Nº 31 (p. 587-602) - 1/1/2000

• iMarina

Spectroscopic multitechnique approach to characterise the oxidation of metals and intermetallic compounds.

Recent Research Developments In Vacuum Science & Technology”, 4th Volume. Transworld Research Network Publisher. (p. 173-189) - 1/1/2003

• ISBN 8178950677

• iMarina

The influence of nitrogen in Ta films on the oxidation of tantalum.

4th European conference on Applications of Surface and Interface Analysis: ECASIA 91. - 1/10/1991

• iMarina

The use of factor analysis for solving analytical problems in AES and XPS: performance and limitations.

5th European Conference on Applications of Surface and Interface Analysis: ECASIA 93. - 1/10/1993

• iMarina

Application of AES and EELS to the study of oxidation and electronic structure of Ti and TiN

5th European Conference on Applications of Surface and Interface Analysis: ECASIA 93. - 1/10/1993

• iMarina

Surface reactivity of tantalum and tantalum nitride thin films.

II Reunión Ibérica del Vacío y sus Aplicaciones + 1st European Topical Conference on Hard Coatings: II RIVA + ETCHC-1. - 1/7/1993

• iMarina

Factor analysis: A useful tool for solving analytical problems in AES and XPS: A study of the performances and limitations of the indicator function

Surface And Interface Analysis (p. 93-97) - 1/1/1994

10.1002/sia.740220123 Ver en origen

• ISSN 01422421

• iMarina

Electrocatálisis: su relevancia en la resolución de problemas energéticos y medioambientales

1/5/1994

• iMarina

Identification of the chemical species formed during the oxidation of polycrystalline aluminum

6th European Conference on Applications of Surface and Interface Analysis: ECASIA 95. - 1/10/1995

• iMarina

Surface characterization of aluminum nitride thin films formed by nitrogen implantation

Vide-Science Technique Et Applications (p. 134-136) - 1/1/1996

• ISSN 12660167

• iMarina

Study of the interface formation in the Ni-Al system

10th International Conference on Thin Films and 5th European Vacuum Conference: ICTF-10/EVC-5. - 1/10/1996

• iMarina

Quantitative depth profiling of nitrogen.implanted aluminum by use of angle resolved X-ray photoelectron spectroscopy.

10th International Conference on Thin Films and 5th European Vacuum Conference: ICTF-10/EVC-5. - 1/10/1996

• iMarina

Iniciación al estudio de la formación de intercaras en materiales compuestos.

Ejecución: 01-01-1993 - 31-12-1993

• iMarina

Resonant photoemission in 4d and 5d Transition-metal series.

Ejecución: 01-01-1993 - 31-12-1993

• iMarina

Un estudio in-situ por técnicas de análisis superficial de la formación de intercaras en materiales compuestos resistentes a la corrosión.

Ejecución: 10-01-1994 - 30-09-1997

• iMarina

Estudio mediante técnicas de análisis superficial, de la formación y crecimiento de intercaras en estructuras multicapas de nitruros de metales.

Ejecución: 10-01-1999 - 09-06-2002

• iMarina

Preparación y caracterización de depósitos de Ag sobre Pt

Ejecución: 01-01-2001 - 31-12-2002

• iMarina

Electronic structure of tantalum oxide and tantalum nitride by resonant photoemission.

Ejecución: 01-01-2001 - 31-12-2001

• iMarina

Electronic characterization of nanostructured Fe-Al alloys and Fe-Al oxides.

Ejecución: 01-01-2001 - 21-12-2001

• iMarina

Growth, electronic properties and thermal stability of Ti/Al2O3 and Ti/Si3N4 interfaces.

Ejecución: 01-01-2002 - 31-12-2002

• iMarina

Crecimiento de compuestos ternarios TiN-(Al, Si, Cr) por implantación con iones N2+ de baja energía, de compuestos intermetálicos Ti-Al, Ti-Si y Ti-Cr: un estudio in-situ por técnicas de superficies.

Ejecución: 01-10-2002 - 30-09-2005

• iMarina

Growth, electronic properties and thermal stability of metal/ceramic interfaces

Ejecución: 01-01-2003 - 31-12-2003

• iMarina