XPS and ARXPS study of silver underpotential deposition on platinum in acid solution

Journal Of Electroanalytical Chemistry (p. 53-58) - 27/3/2003

10.1016/s0022-0728(03)00105-0 View at source

• ISSN 00220728

• iMarina

Ultrathin AlOx-TiOy film formation by controlled oxidation of titaniumdeposited on polycrystalline aluminum surfaces

Journal Of Physical Chemistry b (p. 9590-9596) - 19/9/2002

10.1021/jp025532b View at source

• ISSN 15206106

• iMarina

The room temperature growth of Ti on sputter-cleaned Si(100):Composition and nanostructure of the interface

Surface Science (p. 92-100) - 29/8/2005

10.1016/j.susc.2005.05.032 View at source

• ISSN 00396028

• iMarina

The interface effect on the I-V curves and analysis of ionic diffusion coefficients of polycrystalline CuIn4Te6

Solid State Ionics (p. 47-54) - 29/1/2013

10.1016/j.ssi.2012.12.016 View at source

• ISSN 01672738

• iMarina

The formation of V-Al-N thin films by reactive ion beam mixing of V/Alinterfaces

Applied Physics A-Materials Science & Processing (p. 217-224) - 1/10/2009

10.1007/s00339-009-5181-7 View at source

• ISSN 14320630

• iMarina

The application of ITTFA and ARXPS to study the ion beam mixing ofmetal/Si bilayers

Surface And Interface Analysis (p. 676-682) - 1/3/2008

10.1002/sia.2683 View at source

• ISSN 01422421

• iMarina

Tantalum nitride formation by low-energy (0.5-5 keV) nitrogenimplantation

Surface And Interface Analysis (p. 653-658) - 1/10/2000

10.1002/1096-9918(200010)29:10<653::aid-sia913>3.0.co;2-t View at source

• ISSN 01422421

• iMarina

Synthesis, composition, and electronic structure of Cr-Si-N thin filmsformed by reactive ion beam mixing of Cr/Si interfaces

Journal Of Physical Chemistry c (p. 1589-1593) - 7/2/2008

10.1021/jp0751615 View at source

• ISSN 19327447

• iMarina

Synthesis of hafnium nitride films by 0.5-5 keV nitrogen implantation ofmetallic Hf: an X-ray photoelectron spectroscopy and factor analysisstudy

Surface Science (p. 1-12) - 10/8/2004

10.1016/j.susc.2004.06.162 View at source

• ISSN 00396028

• iMarina

Synthesis of Ti-Cr-N thin films by reactive ion-beam mixing of Ti/Crinterfaces

Surface Science (p. 2385-2391) - 1/6/2006

10.1016/j.susc.2006.03.043 View at source

• ISSN 00396028

• iMarina

Spectroscopic multitechnique approach to characterise the oxidation of metals and intermetallic compounds.

Recent Research Developments In Vacuum Science & Technology”, 4th Volume. Transworld Research Network Publisher. (p. 173-189) - 1/1/2003

• ISBN 8178950677

• iMarina

Espectroscopía de electrones Auger.

Ciencia E Ingeniería De La Superficie De Los Materiales Metálicos. Colección Textos Universitarios, Nº 31 (p. 587-602) - 1/1/2000

• iMarina

Espectroscopía Auger (AES).

Ii Curso De Ciencia E Ingeniería De La Superficie De Los Materiales Metálicos. Cenim/Csic. (p. 469-479) - 1/1/1996

• iMarina

The use of factor analysis for solving analytical problems in AES and XPS: performance and limitations.

5th European Conference on Applications of Surface and Interface Analysis: ECASIA 93. - 1/10/1993

• iMarina

The influence of nitrogen in Ta films on the oxidation of tantalum.

4th European conference on Applications of Surface and Interface Analysis: ECASIA 91. - 1/10/1991

• iMarina

Tailoring optical properties of chromium-silicon mixed oxides by oxygen ion beam implantation.

12th International Conference on Plasma Surface Engineering. PSE2010. - 1/6/2010

• iMarina

Surface reactivity of tantalum and tantalum nitride thin films.

II Reunión Ibérica del Vacío y sus Aplicaciones + 1st European Topical Conference on Hard Coatings: II RIVA + ETCHC-1. - 1/7/1993

• iMarina

Surface characterization of aluminum nitride thin films formed by nitrogen implantation.

5th International Symposium on Trends and New Applications in Thin Films. Hard Coatings: TATF'96. (p. 134-136) - 1/4/1996

• iMarina

Surface characterization of aluminum nitride thin films formed by nitrogen implantation

Vide-Science Technique Et Applications (p. 134-136) - 1/1/1996

• ISSN 12660167

• iMarina

Study of the interface formation in the Ni-Al system

10th International Conference on Thin Films and 5th European Vacuum Conference: ICTF-10/EVC-5. - 1/10/1996

• iMarina

Study of Ni-Al interface formation

Thin Solid Films (p. 55-58) - 1/4/1998

10.1016/s0040-6090(97)00660-3 View at source

• ISSN 00406090

• iMarina

Quantum-well states in ultrathin Ag(111) films deposited onto H-passivated Si(111)-(1x1) surfaces.

13th International Conference on Vacuum Ultraviolet Radiation Physics, VUV XIII. - 1/7/2001

• iMarina

Quantitative depth profiling of nitrogen.implanted aluminum by use of angle resolved X-ray photoelectron spectroscopy.

10th International Conference on Thin Films and 5th European Vacuum Conference: ICTF-10/EVC-5. - 1/10/1996

• iMarina