Siegmann, Philip

Publications

A novel experimental approach for calculating stress intensity factors from isochromatic data

  • Diaz, F.A.
  • Patterson, E.A.
  • Siegmann, P.

Experimental Mechanics (p. 273-281) - 2010

10.1007/s11340-009-9282-1 View at source

  • ISSN/ISBN 0014-4851

A probabilistic source attribution model for nanoparticles in air suspension applied on the main roads of Madrid and Mexico City

  • Siegmann, P.
  • Acevedo, F.J.
  • Siegmann, K.
  • Maldonado-Bascón, S.

Atmospheric Environment (p. 3937-3948) - 2008

10.1016/j.atmosenv.2007.05.021 View at source

  • ISSN/ISBN 1352-2310

A robust approach to demodulating and unwrapping phase-stepped photoelastic data

  • Siegmann, P.
  • Backman, D.
  • Patterson, E.A.

Experimental Mechanics (p. 278-289) - 2005

Editor: SAGE Publications Inc.

10.1177/0014485105054326 View at source

  • ISSN/ISBN 0014-4851

A simultaneous in- and out-of-plane displacement measurement method

  • Siegmann, P.
  • Álvarez-Fernández, V.
  • Díaz-Garrido, F.
  • Patterson, E.A.

Optics Letters (p. 10-12) - 2011

10.1364/ol.36.000010 View at source

  • ISSN/ISBN 0146-9592

Alternative approach for automatic evaluation of traffic sign visibility

  • Siegmann, P.
  • Lafuente-Arroyo, S.
  • Maldonado-Bascón, S.
  • Gil-Jiménez, P.
  • Gómez-Moreno, H.

WSEAS Transactions on Computers (p. 1583-1588) - 2005

  • ISSN/ISBN 1109-2750

An alternative approach for improving DIC by using out-of-plane displacement information

  • Siegmann, P.
  • Felipe-Sesé, L.
  • Díaz, F.A.

Optics and Lasers in Engineering - 2020

Editor: Elsevier Ltd

10.1016/j.optlaseng.2019.105996 View at source

  • ISSN/ISBN 0143-8166

Classification of surface structures on fine metallic wires

  • Bernabeu, E.
  • Sanchez-Brea, L.M.
  • Siegmann, P.
  • Martinez-Antón, J.C.
  • Gomez-Pedrero, J.A.
  • Wilkening, G.
  • Koenders, L.
  • Müller, F.
  • Hildebrand, M.
  • Hermann, H.
... View more Collapse

Applied Surface Science (p. 191-199) - 2001

Editor: Elsevier

10.1016/s0169-4332(01)00322-1 View at source

  • ISSN/ISBN 0169-4332

Computational load reduction in decision functions using support vector machines

  • Acevedo-Rodríguez, J.
  • Maldonado-Bascón, S.
  • Lafuente-Arroyo, S.
  • Siegmann, P.
  • López-Ferreras, F.

Signal Processing (p. 2066-2071) - 2009

10.1016/j.sigpro.2009.03.032 View at source

  • ISSN/ISBN 0165-1684

Detection of surface defects on thin metallic wires by geometric conical diffraction

  • Sánchez-Brea, L.M.
  • Siegmann, P.
  • Bernabeu, E.
  • Rebollo, M.A.
  • Pérez-Quintián, F.
  • Raffo, C.A.

Wire Journal International (p. 124-127) - 2000

  • ISSN/ISBN 0277-4275

Detection of surface defects on thin metallic wires by geometrical conical diffraction

  • Sanchez-Brea, Luis Miguel
  • Siegmann, Philip
  • Bernabeu, Eusebio
  • Rebollo, M.A.
  • Perez-Quintian, F.
  • Raffo, C.A.

Proceedings of the Annual Convention of the Wire Association International (p. 527-530) - 1999

Editor: Wire Assoc Int Inc

  • ISSN/ISBN 0731-4191

Circuitos eléctricos: manual de prácticas de laboratorio

  • Pedro Gil Jiménez
  • Raúl Vicen Bueno
  • Roberto Javier López Sastre
  • Lorena Álvarez Pérez
  • Philip Siegmann

2010

Editor: UNIVERSIDAD DE ALCALA DE HENARES

  • ISBN 978-84-8138-879-4
  • ISSN/ISBN 978-84-8138-879-4

II Jornadas ID+TIC 2008: actas. [Recurso electrónico]

  • Francisco Javier Acevedo Rodríguez (ed. lit.)
  • Enrique Alexandre Cortizo (ed. lit.)
  • Lucas Cuadra Rodriguez (ed. lit.)
  • Pedro Gil Jiménez (ed. lit.)
  • Roberto Gil Pita (ed. lit.)
  • Roberto Javier López Sastre (ed. lit.)
  • Sergio Lafuente Arroyo (ed. lit.)
  • Philip Siegmann (ed. lit.)
... View more Collapse

2009

Editor: Editorial Universidad de Alcalá

  • ISSN/ISBN 978-84-8138-822-0

Manejo de instrumentos del laboratorio de circuitos eléctricos y lineales [Recurso electrónico]

  • Francisco Javier Acevedo Rodríguez
  • Enrique Alexandre Cortizo
  • Lucas Cuadra Rodriguez
  • Pedro Gil Jiménez
  • Roberto Gil Pita
  • Roberto Javier López Sastre
  • Sergio Lafuente Arroyo
  • Philip Siegmann
  • Raúl Vicen Bueno
... View more Collapse

2008

Editor: Editorial Universidad de Alcalá

  • ISSN/ISBN 978-84-8138-797-1

Desarrollo de una herramienta multimedia para la docencia de la asignatura "Laboratorio de circuitos eléctricos"

  • Sergio Lafuente Arroyo
  • Enrique Alexandre Cortizo
  • Francisco Javier Acevedo Rodríguez
  • Pedro Gil Jiménez
  • Roberto Gil Pita
  • Raúl Vicen Bueno
  • Lucas Cuadra Rodriguez
  • Roberto Javier López Sastre
  • Philip Siegmann
... View more Collapse

I Jornadas ID+TIC 2008 [Recurso electrónico]: actas (p. 23) - 2008

Editor: Editorial Universidad de Alcalá

  • ISSN/ISBN 978-84-8138-780-3

El reto de la innovación en el aula: nuestras experiencias

  • Germán Ros Magán
  • María García Castro
  • Philip Siegmann
  • Anibal Nieto Díaz
  • M. Isabel Gegúndez Cámara

Aproximaciones a la coordinación docente: hacia el cambio en la cultura universitaria (p. 273-283) - 2012

Editor: Editorial Universidad de Alcalá

  • ISSN/ISBN 978-84-8138-952-4

A new experimental method for calculating KI and KII using photoelasticity

  • Diaz, F.A.
  • Patterson, E.A.
  • Siegmann, P.

Society for Experimental Mechanics - SEM Annual Conference and Exposition on Experimental and Applied Mechanics 2009 (p. 375-381) - 2009

  • ISSN/ISBN 9781615671892

An approach to the recognition of informational traffic signs based on 2-D homography and SVMs

  • Vázquez-Reina, A.
  • López-Sastre, R.J.
  • Siegmann, P.
  • Lafuente-Arroyo, S.
  • Gómez-Moreno, H.

Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics) (p. 1163-1173) - 2006

Editor: Springer Verlag

10.1007/11864349_106 View at source

  • ISSN/ISBN 9783540446309

An automated calibration system that combines fringe projection and 2D digital image correlation

  • Siegmann, P.
  • Felipe-Sesé, L.A.
  • Díaz Garrido, F.
  • Piñeiro-Ave, J.

Proceedings of SPIE - The International Society for Optical Engineering - 2015

Editor: SPIE

10.1117/12.2191110 View at source

  • ISSN/ISBN 9781628418170

Analytical determination of the uncertainty and the optimum sampling frequency for one-dimensional images with noise

  • Sanchez-Brea, L.M.
  • Siegmann, P.

Applied Optics (p. 6350-6356) - 2008

Editor: OSA - The Optical Society

10.1364/ao.47.006350 View at source

  • ISSN/ISBN 1539-4522

Automatic control of video surveillance camera sabotage

  • Gil-Jiménez, P.
  • López-Sastre, R.
  • Siegmann, P.
  • Acevedo-Rodríguez, J.
  • Maldonado-Bascón, S.

Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics) (p. 222-231) - 2007

Editor: Springer Verlag

10.1007/978-3-540-73055-2_24 View at source

  • ISSN/ISBN 1611-3349

Comparison between optical techniques and confocal microscopy for defect detection on thin wires

  • Siegmann, P.
  • Sanchez-Brea, L.M.
  • Martinez-Anton, J.C.
  • Bernabeu, E.

Applied Surface Science (p. 375-379) - 2004

Editor: Elsevier

10.1016/j.apsusc.2004.05.240 View at source

  • ISSN/ISBN 0169-4332

Detection of surface defects on thin metallic wires by geometrical conical diffraction

  • Sanchez-Brea, LM
  • Siegmann, P
  • Bernabeu, E
  • Rebollo, MA
  • Perez-Quintian, F
  • Raffo, CA

WIRE & CABLE TECHNICAL SYMPOSIUM (WCTS), CONFERENCE PROCEEDINGS (p. 527-530) - 1998

Editor: WIRE ASSOC INT

  • ISSN/ISBN *************

Determination of the isoclinic map for complex photoelastic fringe patterns

  • Siegmann, P.
  • Colombo, C.
  • Díaz-Garrido, F.
  • Patterson, E.

Conference Proceedings of the Society for Experimental Mechanics Series (p. 79-85) - 2011

Editor: Springer New York LLC

10.1007/978-1-4419-9792-0_14 View at source

  • ISSN/ISBN 2191-5652

Determination of the isoclinic map for complex photoelastic fringe patterns

  • Siegmann, P.
  • Colombo, C.
  • Díaz-Garrido, F.
  • Patterson, E.

Society for Experimental Mechanics - SEM Annual Conference and Exposition on Experimental and Applied Mechanics 2010 (p. 167-173) - 2010

  • ISSN/ISBN 9781617386909

In-line detection and evaluation of surface defects on thin metallic wires

  • Martínez-Antón, J.C.
  • Siegmann, P.
  • Sanchez-Brea, L.M.
  • Bernabeu, E.
  • Gómez-Pedrero, J.A.
  • Canabal, H.

Proceedings of SPIE - The International Society for Optical Engineering (p. 27-34) - 2001

10.1117/12.445586 View at source

  • ISSN/ISBN 0277-786X

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Last data update: 4/24/24 1:13 PM