RDF/XML JSON-LD N3/Turtle RDF/JSON

Castilla González, Elena María elena.castilla@urjc.es

Matemática Aplicada, Ciencia e Ingeniería de los Materiales y Tecnología Electrónica / Universidad Rey Juan Carlos

Publications

Robust approach for comparing two dependent normal populations through Wald-type tests based on Renyi's pseudodistance estimators

  • Castilla, Elena
  • Jaenada, Maria
  • Martin, Nirian
  • Pardo, Leandro;

Statistics And Computing - 1/12/2022

10.1007/s11222-022-10162-7 View at source

  • ISSN 09603174

Composite likelihood methods: Rao-type tests based on composite minimum density power divergence estimator

  • Castilla, E.
  • Martin, N.
  • Pardo, L.
  • Zografos, K.;

Statistical Papers (p. 1003-1041) - 1/4/2021

10.1007/s00362-019-01122-x View at source

  • ISSN 09325026

Optimal designs of constant-stress accelerated life-tests for one-shot devices with model misspecification analysis

  • Balakrishnan, Narayanaswamy
  • Castilla, Elena
  • Ling, Man Ho;

Quality And Reliability Engineering International (p. 989-1012) - 1/1/2022

10.1002/qre.3031 View at source

  • ISSN 10991638

Robust inference for nondestructive one-shot device testing under step-stress model with exponential lifetimes

  • Balakrishnan, Narayanaswamy
  • Castilla, Elena
  • Jaenada, Maria
  • Pardo, Leandro;

Quality And Reliability Engineering International (p. 1192-1222) - 16/2/2023

10.1002/qre.3287 View at source

  • ISSN 10991638

Robust inference for one-shot device testing data under exponential lifetime model with multiple stresses

  • Balakrishnan, Narayanaswamy
  • Castilla, Elena
  • Martin, Nirian
  • Pardo, Leandro;

Quality And Reliability Engineering International (p. 1916-1930) - 20/5/2020

10.1002/qre.2665 View at source

  • ISSN 10991638

EM-based likelihood inference for one-shot device test data under log-normal lifetimes and the optimal design of a CSALT plan

  • Balakrishnan, Narayanaswamy
  • Castilla, Elena;

Quality And Reliability Engineering International (p. 780-799) - 1/1/2022

10.1002/qre.3014 View at source

  • ISSN 10991638

Robust estimators for one-shot device testing data under gamma lifetime model with an application to a tumor toxicological data

  • Balakrishnan, N.
  • Castilla, E.
  • Martin, N.
  • Pardo, L.;

Metrika (p. 991-1019) - 1/11/2019

10.1007/s00184-019-00718-5 View at source

  • ISSN 00261335

Robust Wald-type tests based on minimum Renyi pseudodistance estimators for the multiple linear regression model

  • Castilla, E.
  • Martin, N.
  • Munoz, S.
  • Pardo, L.;

Journal Of Statistical Computation And Simulation (p. 2655-2680) - 4/7/2020

10.1080/00949655.2020.1787410 View at source

  • ISSN 00949655

On distance-type Gaussian estimation

  • Castilla, Elena
  • Zografos, Konstantinos;

Journal Of Multivariate Analysis - 1/3/2022

10.1016/j.jmva.2021.104831 View at source

  • ISSN 0047259X

Power divergence approach for one-shot device testing under competing risks

  • Balakrishnan N
  • Castilla E
  • Martin N
  • Pardo L

Journal Of Computational And Applied Mathematics - 1/2/2023

10.1016/j.cam.2022.114676 View at source

  • ISSN 03770427

This researcher has no books.

On the Choice of the Optimal Tuning Parameter in Robust One-Shot Device Testing Analysis

  • Castilla E
  • Chocano PJ

Studies In Systems, Decision And Control (p. 169-180) - 1/1/2023

10.1007/978-3-031-04137-2_16 View at source

  • ISSN 21984190

A Logistic Regression Analysis Approach for Sample Survey Data Based on Phi-Divergence Measures

  • Castilla, Elena
  • Martin, Nirian
  • Pardo, Leandro;

Studies In Systems, Decision And Control (p. 465-474) - 1/1/2018

10.1007/978-3-319-73848-2_43 View at source

  • ISSN 21984190

This researcher has no conferences.

This researcher has no working papers.

This researcher has no technical reports.

This researcher has no research projects.

This researcher has no supervised thesis.

This researcher has no patents or software licenses.

Last data update: 7/14/23 2:02 PM