Total ionizing dose effects on a delay-based physical unclonable function implemented in FPGAs

Electronics - 8/2018

https://doi.org/10.3390/electronics7090163 Ver en origen

• EISSN 2079-9292

• UC3M

On the Entropy of Oscillator-Based True Random Number Generators under Ionizing Radiation

Entropy (Entropy) - 7/2018

10.3390/e20070513 Ver en origen

• ISSN 1099-4300

• UC3M

Low-Power Design in Aerospace Circuits: A Case Study

IEEE AEROSPACE AND ELECTRONIC SYSTEMS MAGAZINE (p. 46-52) - 12/2013

https://doi.org/10.1109/maes.2013.6693668 Ver en origen

• EISSN 1557-959X
• ISSN 0885-8985

• UC3M

A true random number generator based on gait data for the Internet of you

IEEE Access (p. 71642-71651) - 4/2020

https://doi.org/10.1109/access.2020.2986822 Ver en origen

• EISSN 2169-3536
• ISSN 2169-3536

• UC3M

Reduced resolution redundancy: A novel approximate error mitigation technique

IEEE Access (p. 20643-20651) - 2/2022

https://doi.org/10.1109/access.2022.3152202 Ver en origen

• EISSN 2169-3536

• UC3M

Using Approximate Circuits Against Hardware Trojans

IEEE Design & Test - 10/2021

10.1109/mdat.2021.3117741 Ver en origen

• ISSN 2168-2356

• UC3M

Towards a Dependable True Random Number Generator With Self-Repair Capabilities

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS (p. 247-256) - 1/2018

https://doi.org/10.1109/tcsi.2017.2711033 Ver en origen

• EISSN 1558-0806
• ISSN 1549-8328

• UC3M

Online test of control flow errors: a new debug interface-based approach

IEEE TRANSACTIONS ON COMPUTERS (p. 1846-1855) - 6/2016

https://doi.org/10.1109/tc.2015.2456014 Ver en origen

• EISSN 1557-9956
• ISSN 0018-9340

• UC3M

Soft Error Sensitivity Evaluation of Microprocessors by Multilevel Emulation-Based Fault Injection

IEEE TRANSACTIONS ON COMPUTERS (p. 313-322) - 3/2012

https://doi.org/10.1109/tc.2010.262 Ver en origen

• EISSN 1557-9956
• ISSN 0018-9340

• UC3M

Hybrid Lockstep Technique for Soft Error Mitigation

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 1574-1581) - 7/2022

https://doi.org/10.1109/tns.2022.3149867 Ver en origen

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

Fault-tolerance techniques for soft-core processors using the trace interface. In: FPGAs and parallel architectures for aerospace applications

FPGAs and parallel architectures for aerospace applications (p. 293-293-306) - 1/2016

Editor: SPRINGER

https://doi.org/10.1007/978-3-319-14352-1_19 Ver en origen

• ISBN 978-3-319-14351-4

• UC3M

Hardware Fault Injection. In: Soft Errors in Modern Electronic Systems

Soft Errors in Modern Electronic Systems (p. 141-166) - 11/2010

Editor: SPRINGER

https://doi.org/10.1007/978-1-4419-6993-4_6 Ver en origen

• ISBN 978-1-4419-6992-7

• UC3M

The Use of Benchmarks for High-Reliability Systems

11th IEEE Workshop on Silicon Errors in Logic - System Effects<br/>(SELSE 2015) - 2015

• UC3M

Using an FPGA-Based Fault Injection Technique to Evaluate Software Robustness Under SEEs: A Case Study

12th Latin American test Workshop (LATW 2011) - 2011

Editor: IEEE - THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, INC

• ISBN 978-1-4577-1489-4

• UC3M

Smart Hardening for Round-based Encryption Algoritms: Application to Advanced Encryptijon Standard

14th IEEE International On-Line Testing Symposium (IOLTS) - 2008

• UC3M

C-Element model for SET fault emulation

14th Radiation Effects on Components and Systems (RADECS 2013) (p. 1-4) - 2013

Editor: IEEE - THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, INC

https://doi.org/10.1109/radecs.2013.6937389 Ver en origen

• ISBN 978-1-4673-5057-0

• UC3M

Fault Injection and Formal Verification Methodologies

15th International School on the Effects of Radiation on Embedded Systems for Space Applications (SERESSA 2019) - 2019

• UC3M

Akari-X: A Pseudorandom Number Generator for Secure Lightweight Systems

17th International On-Line Testing Symposium (IOLTS 2011) (p. 228-233) - 2011

Editor: IEEE - THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, INC

• ISBN 978-1-4577-1053-7

• UC3M

Coarse-Grain Dynamically Reconfigurable Coprocessor for Image Processing in SoPC

18th International Conference on Field Programmable Logic and Applications (FPL 2008) - 2008

• UC3M

Logic Masking for SET Mitigation Using Approximate Logic Circuits

18th International On-Line Testing Symposium (IOLTS 2012) (p. 176-181) - 2012

Editor: IEEE - THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, INC

https://doi.org/10.1109/iolts.2012.6313868 Ver en origen

• ISBN 978-1-4673-2082-5

• UC3M

SEU Sensitivity of Robust Communication Protocols

18th International On-Line Testing Symposium (IOLTS 2012) (p. 188-193) - 2012

Editor: IEEE - THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, INC

• ISBN 978-1-4673-2082-5

• UC3M

Exploiting the debug interface to support on-line test of control flow errors

19 th IEEE International On-line Testing Symposium (IOLTS 2013) (p. 98-103) - 2013

Editor: IEEE - THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, INC

https://doi.org/10.1109/iolts.2013.6604058 Ver en origen

• ISBN 978-1-4799-0664-2

• UC3M

Error Detection and Diagnosis for System-on-Chip in Space Applications

Fecha de defensa: 20-06-2022

• UC3M

Técnicas<br/> Híbridas de Tolerancia a Fallos en Microprocesadores

Fecha de defensa: 15-11-2017

• UC3M

Contribución al reconocimiento de huellas dactilares mediante técnicas de correlación y arquitecturas hardware para el aumento de prestaciones

Fecha de defensa: 08-05-2009

• UC3M

Transient<br/> error mitigation by means of approximate logic circuits

Fecha de defensa: 03-11-2017

• UC3M

Dispositivo y procedimiento para la identificación unívoca de un circuito integrado

3/5/2019

Fecha de registro: 31-03-2017

Fecha de concesión: 03-05-2019

• UC3M