SET Emulation under a Quantized Delay Model

JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS (p. 107-116) - 2/2009

https://doi.org/10.1007/s10836-008-5081-3 Ver en origen

• EISSN 1573-0727
• ISSN 0923-8174

• UC3M

Analysis of Turbo Decoder Robustness Against SEU Effects

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 2184-2188) - 8/2009

https://doi.org/10.1109/tns.2009.2018270 Ver en origen

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

SET Emulation Considering Electrical Masking Effects

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 2015-2021) - 8/2009

https://doi.org/10.1109/tns.2009.2013346 Ver en origen

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

Analyzing the Impact of Single-Event-Induced Charge Sharing in Complex Circuits

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 2768-2775) - 12/2011

https://doi.org/10.1109/tns.2011.2168239 Ver en origen

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

Fault Injection in Modern Microprocessors Using On-Chip Debugging Infrastructures

IEEE Transactions on Dependable and Secure Computing (p. 308-314) - 3/2011

https://doi.org/10.1109/tdsc.2010.50 Ver en origen

• EISSN 1941-0018
• ISSN 1545-5971

• UC3M

Analysis of SET effects in a PIC microprocessor for selective hardening

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 1078-1085) - 6/2011

https://doi.org/10.1109/tns.2010.2096433 Ver en origen

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

Evaluating the Effectiveness of a Software-Based Technique Under SEEs Using FPGA-Based Fault Injection Approach

JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS (p. 777-789) - 12/2012

https://doi.org/10.1007/s10836-012-5321-4 Ver en origen

• EISSN 1573-0727
• ISSN 0923-8174

• UC3M

Soft Error Sensitivity Evaluation of Microprocessors by Multilevel Emulation-Based Fault Injection

IEEE TRANSACTIONS ON COMPUTERS (p. 313-322) - 3/2012

https://doi.org/10.1109/tc.2010.262 Ver en origen

• EISSN 1557-9956
• ISSN 0018-9340

• UC3M

On the use of embedded debug features for permanent and transient fault resilience in microprocessors

MICROPROCESSORS AND MICROSYSTEMS (p. 334-343) - 7/2012

https://doi.org/10.1016/j.micpro.2012.02.013 Ver en origen

• ISSN 0141-9331

• UC3M

A co-design approach for SET mitigation in embedded systems

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 1034-1039) - 8/2012

https://doi.org/10.1109/tns.2011.2182524 Ver en origen

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

Hardware Fault Injection. In: Soft Errors in Modern Electronic Systems

Soft Errors in Modern Electronic Systems (p. 141-166) - 11/2010

Editor: SPRINGER

https://doi.org/10.1007/978-1-4419-6993-4_6 Ver en origen

• ISBN 978-1-4419-6992-7

• UC3M

Fault-tolerance techniques for soft-core processors using the trace interface. In: FPGAs and parallel architectures for aerospace applications

FPGAs and parallel architectures for aerospace applications (p. 293-293-306) - 1/2016

Editor: SPRINGER

https://doi.org/10.1007/978-3-319-14352-1_19 Ver en origen

• ISBN 978-3-319-14351-4

• UC3M

Coarse-Grain Dynamically Reconfigurable Coprocessor for Image Processing in SoPC

18th International Conference on Field Programmable Logic and Applications (FPL 2008) - 2008

• UC3M

Redundancia temporal configurable para algoritmos criptográficos robustos

Jornadas de Computación Reconfigurable - 2008

• UC3M

Smart Hardening for Round-based Encryption Algoritms: Application to Advanced Encryptijon Standard

14th IEEE International On-Line Testing Symposium (IOLTS) - 2008

• UC3M

The Effects of Proton Irradiation on CoolRunner-II CPLD Technology

8th European Workshop on Radiation Effects on Components and Systems - 2008

• UC3M

SET Emulation Considering Electrical Masking Effects

8th European Workshop on Radiation Effects on Components and Systems - 2008

• UC3M

Analysis of Turbo Decoder Robustness Against SEU Effects

8th European Workshop on Radiation Effects on Components and Systems (RADECS 2008) - 2008

• UC3M

Extensive SEU impact analysis of a PIC microprocessor for selective hardening

Radiation Effects on Components and Systems Workshop (RADECS) (p. 1986-1991) - 2010

Editor: IEEE INTERNATIONAL LLC

https://doi.org/10.1109/tns.2009.2039581 Ver en origen

• ISBN 1558-1578

• UC3M

ATOM: A Pseudorandom Number Generator Suitable for RFID Protocols

XXVI Design of Circuits and Integrated Systems (DCIS 2011) - 2011

• UC3M

Akari-X: A Pseudorandom Number Generator for Secure Lightweight Systems

17th International On-Line Testing Symposium (IOLTS 2011) (p. 228-233) - 2011

Editor: IEEE - THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, INC

• ISBN 978-1-4577-1053-7

• UC3M

Using an FPGA-Based Fault Injection Technique to Evaluate Software Robustness Under SEEs: A Case Study

12th Latin American test Workshop (LATW 2011) - 2011

Editor: IEEE - THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, INC

• ISBN 978-1-4577-1489-4

• UC3M

Contribución al reconocimiento de huellas dactilares mediante técnicas de correlación y arquitecturas hardware para el aumento de prestaciones

Fecha de defensa: 08-05-2009

• UC3M

Técnicas<br/> Híbridas de Tolerancia a Fallos en Microprocesadores

Fecha de defensa: 15-11-2017

• UC3M

Error Detection and Diagnosis for System-on-Chip in Space Applications

Fecha de defensa: 20-06-2022

• UC3M

Transient<br/> error mitigation by means of approximate logic circuits

Fecha de defensa: 03-11-2017

• UC3M

Dispositivo y procedimiento para la identificación unívoca de un circuito integrado

3/5/2019

Fecha de registro: 31-03-2017

Fecha de concesión: 03-05-2019

• UC3M