On the use of embedded debug features for permanent and transient fault resilience in microprocessors

MICROPROCESSORS AND MICROSYSTEMS (p. 334-343) - 7/2012

https://doi.org/10.1016/j.micpro.2012.02.013 View at source

• ISSN 0141-9331

• UC3M

Analysis of neutron sensitivity and data-flow error detection in ARM microprocessors using NEON SIMD extensions

MICROELECTRONICS RELIABILITY (p. 113346) - 9/2019

https://doi.org/10.1016/j.microrel.2019.06.038 View at source

• ISSN 0026-2714

• UC3M

Dual-Core Lockstep enhanced with redundant multithread support and control-flow error detection

MICROELECTRONICS RELIABILITY (p. 113447) - 9/2019

https://doi.org/10.1016/j.microrel.2019.113447 View at source

• ISSN 0026-2714

• UC3M

PTM-based hybrid error-detection architecture for ARM microprocessors

MICROELECTRONICS RELIABILITY (p. 925-930) - 9/2018

https://doi.org/10.1016/j.microrel.2018.07.074 View at source

• ISSN 0026-2714

• UC3M

Error sensitivity study of FFT architectures implemented in FPGA

MICROELECTRONICS RELIABILITY (p. 1-5) - 11/2021

https://doi.org/10.1016/j.microrel.2021.114298 View at source

• ISSN 0026-2714

• UC3M

SET Emulation under a Quantized Delay Model

JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS (p. 107-116) - 2/2009

https://doi.org/10.1007/s10836-008-5081-3 View at source

• EISSN 1573-0727
• ISSN 0923-8174

• UC3M

Evaluating the Effectiveness of a Software-Based Technique Under SEEs Using FPGA-Based Fault Injection Approach

JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS (p. 777-789) - 12/2012

https://doi.org/10.1007/s10836-012-5321-4 View at source

• EISSN 1573-0727
• ISSN 0923-8174

• UC3M

Dynamic control of entropy and power consumption in TRNGs for IoT applications

IEICE Electronics Express (p. 1-11) - 1/2018

https://doi.org/10.1587/elex.14.20171157 View at source

• EISSN 1349-9467
• ISSN 1349-2543

• UC3M

A hardware-software approach for on-line soft error mitigation in interrupt-driven applications

IEEE Transactions on Dependable and Secure Computing (p. 502-508) - 7/2016

https://doi.org/10.1109/tdsc.2014.2382593 View at source

• EISSN 1941-0018
• ISSN 1545-5971

• UC3M

Fault Injection in Modern Microprocessors Using On-Chip Debugging Infrastructures

IEEE Transactions on Dependable and Secure Computing (p. 308-314) - 3/2011

https://doi.org/10.1109/tdsc.2010.50 View at source

• EISSN 1941-0018
• ISSN 1545-5971

• UC3M

Hardware Fault Injection. In: Soft Errors in Modern Electronic Systems

Soft Errors in Modern Electronic Systems (p. 141-166) - 11/2010

Editor: SPRINGER

https://doi.org/10.1007/978-1-4419-6993-4_6 View at source

• ISBN 978-1-4419-6992-7

• UC3M

Fault-tolerance techniques for soft-core processors using the trace interface. In: FPGAs and parallel architectures for aerospace applications

FPGAs and parallel architectures for aerospace applications (p. 293-293-306) - 1/2016

Editor: SPRINGER

https://doi.org/10.1007/978-3-319-14352-1_19 View at source

• ISBN 978-3-319-14351-4

• UC3M

Evaluating Fundamental Matrix Operations on Multi-core System-on-Chip

XXXVI Conference on Design of Circuits and Integrated Systems (DCIS) 2021 - 2021

• UC3M

Approximate logic functions for SET mitigation in sequential circuits

XXVII International Conference on Design of Circuits and Integrated Circuits (DCIS 2012) (p. 195-200) - 2012

• ISBN 978295174614

• UC3M

SET Fault Injection Attacks on a Hardware Implementation of the SHA Cypher

XXVII Design of Circuits and Integrated Systems (DCIS 2012) - 2012

• UC3M

Control Flow Checking through Embedded Debug Interface

XXVI Design of Circuits and Integrated Systems (DCIS 2011) - 2011

• UC3M

ATOM: A Pseudorandom Number Generator Suitable for RFID Protocols

XXVI Design of Circuits and Integrated Systems (DCIS 2011) - 2011

• UC3M

Comparative of software-based hardening techniques for LEON 3 microprocessor

XXIX Conference on Design of Circuits and Integrated Systems (DCIS 2014) - 2014

• UC3M

Comparative of proton radiation data for 28 nm Zynq-7000 SoC

Radiation and its Effects on Components and Systems Conference (RADECS) 2022 - 2022

• UC3M

Sensitivity Evaluation Method for Aerospace Digital Systems with Collaborative Hardening

Radiation Effects on Components and Systems Workshop (RADECS) (p. 1053-1058) - 2011

Editor: IEEE INTERNATIONAL LLC

https://doi.org/10.1109/tns.2011.2109397 View at source

• ISBN 9781457705854

• UC3M

Extensive SEU impact analysis of a PIC microprocessor for selective hardening

Radiation Effects on Components and Systems Workshop (RADECS) (p. 1986-1991) - 2010

Editor: IEEE INTERNATIONAL LLC

https://doi.org/10.1109/tns.2009.2039581 View at source

• ISBN 1558-1578

• UC3M

Redundancia temporal configurable para algoritmos criptográficos robustos

Jornadas de Computación Reconfigurable - 2008

• UC3M

Error Detection and Diagnosis for System-on-Chip in Space Applications

Reading date: 20-06-2022

• UC3M

Técnicas<br/> Híbridas de Tolerancia a Fallos en Microprocesadores

Reading date: 15-11-2017

• UC3M

Contribución al reconocimiento de huellas dactilares mediante técnicas de correlación y arquitecturas hardware para el aumento de prestaciones

Reading date: 08-05-2009

• UC3M

Transient<br/> error mitigation by means of approximate logic circuits

Reading date: 03-11-2017

• UC3M

Dispositivo y procedimiento para la identificación unívoca de un circuito integrado

3/5/2019

Date filed: 31-03-2017

Date issued: 03-05-2019

• UC3M