HW/SW Co-Simulation System for Enhancing Hardware-in-the-Loop of Power Converter Digital Controllers

IEEE Journal of Emerging and Selected Topics in Power Electronics (p. 1779-1786) - 12/2017

https://doi.org/10.1109/jestpe.2017.2739710 Ver en origen

• EISSN 2168-6785
• ISSN 2168-6777

• UC3M

Soft Error Sensitivity Evaluation of Microprocessors by Multilevel Emulation-Based Fault Injection

IEEE TRANSACTIONS ON COMPUTERS (p. 313-322) - 3/2012

https://doi.org/10.1109/tc.2010.262 Ver en origen

• EISSN 1557-9956
• ISSN 0018-9340

• UC3M

Analysis of SET effects in a PIC microprocessor for selective hardening

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 1078-1085) - 6/2011

https://doi.org/10.1109/tns.2010.2096433 Ver en origen

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

Evaluation of the Suitability of NEON SIMD Microprocessor Extensions Under Proton Irradiation

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 1835-1842) - 8/2018

https://doi.org/10.1109/tns.2018.2823540 Ver en origen

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

A hybrid fault-tolerant LEON3 soft core processor implemented in low-end SRAM FPGA

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 374-381) - 1/2017

https://doi.org/10.1109/tns.2016.2636574 Ver en origen

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

Online error detection through trace infrastructure in ARM microprocessors

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 1457-1464) - 7/2019

https://doi.org/10.1109/tns.2019.2921767 Ver en origen

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

Partial TMR in FPGAs Using Approximate Logic Circuits

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 2233-2240) - 8/2016

https://doi.org/10.1109/tns.2016.2541700 Ver en origen

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

Using Benchmarks for Radiation Testing of Microprocessors and FPGAs

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 2547-2554) - 12/2015

https://doi.org/10.1109/tns.2015.2498313 Ver en origen

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

Error Detection and Mitigation of Data-Intensive Microprocessor Applications Using SIMD and Trace Monitoring

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 1452-1460) - 7/2020

https://doi.org/10.1109/tns.2020.2992299 Ver en origen

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

The Use of Microprocessor Trace Infrastructures for Radiation-Induced Fault Diagnosis

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 126-134) - 1/2020

https://doi.org/10.1109/tns.2019.2956204 Ver en origen

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

Hardware Fault Injection. In: Soft Errors in Modern Electronic Systems

Soft Errors in Modern Electronic Systems (p. 141-166) - 11/2010

Editor: SPRINGER

https://doi.org/10.1007/978-1-4419-6993-4_6 Ver en origen

• ISBN 978-1-4419-6992-7

• UC3M

The Use of Benchmarks for High-Reliability Systems

11th IEEE Workshop on Silicon Errors in Logic - System Effects<br/>(SELSE 2015) - 2015

• UC3M

Using an FPGA-Based Fault Injection Technique to Evaluate Software Robustness Under SEEs: A Case Study

12th Latin American test Workshop (LATW 2011) - 2011

Editor: IEEE - THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, INC

• ISBN 978-1-4577-1489-4

• UC3M

Smart Hardening for Round-based Encryption Algoritms: Application to Advanced Encryptijon Standard

14th IEEE International On-Line Testing Symposium (IOLTS) - 2008

• UC3M

C-Element model for SET fault emulation

14th Radiation Effects on Components and Systems (RADECS 2013) (p. 1-4) - 2013

Editor: IEEE - THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, INC

https://doi.org/10.1109/radecs.2013.6937389 Ver en origen

• ISBN 978-1-4673-5057-0

• UC3M

Verifying hardening techniques for distributed electronic systems in critical applications

15th European Conference onRadiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on - 2015

https://doi.org/10.1109/radecs.2015.7365695 Ver en origen

• UC3M

Reducing SEU sensitivity in LIN networks: selective and collaborative hardening techniques

15th IEEE Latin-American Test Workshop (LATW2014) (p. 1-6) - 2014

Editor: IEEE Press

https://doi.org/10.1109/latw.2014.6841924 Ver en origen

• ISBN 978-1-4799-4711-9

• UC3M

SEU Sensitivity of Robust Communication Protocols

18th International On-Line Testing Symposium (IOLTS 2012) (p. 188-193) - 2012

Editor: IEEE - THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, INC

• ISBN 978-1-4673-2082-5

• UC3M

Logic Masking for SET Mitigation Using Approximate Logic Circuits

18th International On-Line Testing Symposium (IOLTS 2012) (p. 176-181) - 2012

Editor: IEEE - THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, INC

https://doi.org/10.1109/iolts.2012.6313868 Ver en origen

• ISBN 978-1-4673-2082-5

• UC3M

Hardening of serial communication protocols for potentially critical systems in automotive applications: LIN bus

19 th IEEE International On-line Testing Symposium (IOLTS 2013) (p. 13-18) - 2013

Editor: IEEE - THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, INC

https://doi.org/10.1109/iolts.2013.6604044 Ver en origen

• ISBN 978-1-4799-0664-2

• UC3M

Study on the Effect of Multiple Errors in Robust Systems Based on Critical Task Distribution

2011 12th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (p. 463-466) - 2011

Editor: IEEE - THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, INC

• ISBN 978-1-4577-0585-4

• UC3M