The Use of Benchmarks for High-Reliability Systems - Sanchez Clemente, Antonio Jose; Entrena Arrontes, Luis Alfonso; Garcia Valderas, Mario; Aguirre, Miguel; Quinn, Heather; Robinson, William H.; Rech, Paolo; Barnard, Arno; Desogus, Marco; Guertín, Steven M.; Kaeli, David; Kastensmidt, Fernanda Lima; et al. (11th IEEE Workshop on Silicon Errors in Logic - System Effects (SELSE 2015), 2015)