Using Benchmarks for Radiation Testing of Microprocessors and FPGAs

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 2547-2554) - 12/2015

https://doi.org/10.1109/tns.2015.2498313 Ver en origen

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

The Use of Microprocessor Trace Infrastructures for Radiation-Induced Fault Diagnosis

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 126-134) - 1/2020

https://doi.org/10.1109/tns.2019.2956204 Ver en origen

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

Solar Energy Harvesting to Improve Capabilities of Wearable Devices

Sensors (p. 3950-3971) - 5/2022

https://doi.org/10.3390/s22103950 Ver en origen

• EISSN 1424-8220
• ISSN 1424-3210

• UC3M

Soft Error Sensitivity Evaluation of Microprocessors by Multilevel Emulation-Based Fault Injection

IEEE TRANSACTIONS ON COMPUTERS (p. 313-322) - 3/2012

https://doi.org/10.1109/tc.2010.262 Ver en origen

• EISSN 1557-9956
• ISSN 0018-9340

• UC3M

SET Emulation under a Quantized Delay Model

JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS (p. 107-116) - 2/2009

https://doi.org/10.1007/s10836-008-5081-3 Ver en origen

• EISSN 1573-0727
• ISSN 0923-8174

• UC3M

SET Emulation Considering Electrical Masking Effects

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 2015-2021) - 8/2009

https://doi.org/10.1109/tns.2009.2013346 Ver en origen

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

Reliability Evaluation of LU Decomposition on GPU-Accelerated System-on-Chip Under Proton Irradiation

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 1467-1474) - 7/2022

https://doi.org/10.1109/tns.2022.3155820 Ver en origen

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

Radiation Testing of a Multiprocessor Macrosynchronized Lockstep Architecture With FreeRTOS

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 462-469) - 11/2021

https://doi.org/10.1109/tns.2021.3129164 Ver en origen

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

Partial TMR in FPGAs Using Approximate Logic Circuits

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 2233-2240) - 8/2016

https://doi.org/10.1109/tns.2016.2541700 Ver en origen

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

PTM-based hybrid error-detection architecture for ARM microprocessors

MICROELECTRONICS RELIABILITY (p. 925-930) - 9/2018

https://doi.org/10.1016/j.microrel.2018.07.074 Ver en origen

• ISSN 0026-2714

• UC3M

Hardware Fault Injection. In: Soft Errors in Modern Electronic Systems

Soft Errors in Modern Electronic Systems (p. 141-166) - 11/2010

Editor: SPRINGER

https://doi.org/10.1007/978-1-4419-6993-4_6 Ver en origen

• ISBN 978-1-4419-6992-7

• UC3M

Verifying hardening techniques for distributed electronic systems in critical applications

15th European Conference onRadiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on - 2015

https://doi.org/10.1109/radecs.2015.7365695 Ver en origen

• UC3M

Using an FPGA-Based Fault Injection Technique to Evaluate Software Robustness Under SEEs: A Case Study

12th Latin American test Workshop (LATW 2011) - 2011

Editor: IEEE - THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, INC

• ISBN 978-1-4577-1489-4

• UC3M

The Use of Benchmarks for High-Reliability Systems

11th IEEE Workshop on Silicon Errors in Logic - System Effects<br/>(SELSE 2015) - 2015

• UC3M

The Effects of Proton Irradiation on CoolRunner-II CPLD Technology

8th European Workshop on Radiation Effects on Components and Systems - 2008

• UC3M

System Dependability in Edge Computing Wearable Devices

DCIS 2020 - 35th Conference on Design of Circuits and Integrated Systems Virtual Conference<br/> (p. 1-6) - 2020

Editor: IEEE.THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, INC

https://doi.org/10.1109/dcis51330.2020.9268674 Ver en origen

• ISBN 978-1-7281-9132-4

• UC3M

Study on the Effect of Multiple Errors in Robust Systems Based on Critical Task Distribution

2011 12th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (p. 463-466) - 2011

Editor: IEEE - THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, INC

• ISBN 978-1-4577-0585-4

• UC3M

Smart Hardening for Round-based Encryption Algoritms: Application to Advanced Encryptijon Standard

14th IEEE International On-Line Testing Symposium (IOLTS) - 2008

• UC3M

Sensitivity Evaluation Method for Aerospace Digital Systems with Collaborative Hardening

Radiation Effects on Components and Systems Workshop (RADECS) (p. 1053-1058) - 2011

Editor: IEEE INTERNATIONAL LLC

https://doi.org/10.1109/tns.2011.2109397 Ver en origen

• ISBN 9781457705854

• UC3M

SEU Sensitivity of Robust Communication Protocols

18th International On-Line Testing Symposium (IOLTS 2012) (p. 188-193) - 2012

Editor: IEEE - THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, INC

• ISBN 978-1-4673-2082-5

• UC3M

SEU Sensitivity Comparison for Different Reprogrammable Technologies With Minority Check Block

Conference on Radiation and its Effects on Components and Systems (RADECS 2012) (p. 2813-2818) - 2013

Editor: IEEE - THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, INC

https://doi.org/10.1109/tns.2013.2245343 Ver en origen

• ISBN 0018-9499

• UC3M