Reliability Evaluation of LU Decomposition on GPU-Accelerated System-on-Chip Under Proton Irradiation

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 1467-1474) - 7/2022

https://doi.org/10.1109/tns.2022.3155820 Ver en origen

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

Analyzing Scaled Reduced Precision Redundancy for Error Mitigation under Proton Irradiation

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 1485-1491) - 7/2022

https://doi.org/10.1109/tns.2022.3147599 Ver en origen

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

Solar Energy Harvesting to Improve Capabilities of Wearable Devices

Sensors (p. 3950-3971) - 5/2022

https://doi.org/10.3390/s22103950 Ver en origen

• EISSN 1424-8220
• ISSN 1424-3210

• UC3M

Comparison of parallel implementation strategies in GPU-accelerated System-on-Chip under proton irradiation

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 444-452) - 3/2022

10.1109/tns.2021.3128722 Ver en origen

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

Analyzing Reduced Precision Triple Modular Redundancy under Proton Irradiation

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 470-477) - 3/2022

https://doi.org/10.1109/tns.2022.3152088 Ver en origen

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

Error sensitivity study of FFT architectures implemented in FPGA

MICROELECTRONICS RELIABILITY (p. 1-5) - 11/2021

https://doi.org/10.1016/j.microrel.2021.114298 Ver en origen

• ISSN 0026-2714

• UC3M

Radiation Testing of a Multiprocessor Macrosynchronized Lockstep Architecture With FreeRTOS

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 462-469) - 11/2021

https://doi.org/10.1109/tns.2021.3129164 Ver en origen

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

Error Detection and Mitigation of Data-Intensive Microprocessor Applications Using SIMD and Trace Monitoring

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 1452-1460) - 7/2020

https://doi.org/10.1109/tns.2020.2992299 Ver en origen

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

The Use of Microprocessor Trace Infrastructures for Radiation-Induced Fault Diagnosis

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 126-134) - 1/2020

https://doi.org/10.1109/tns.2019.2956204 Ver en origen

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

Analysis of neutron sensitivity and data-flow error detection in ARM microprocessors using NEON SIMD extensions

MICROELECTRONICS RELIABILITY (p. 113346) - 9/2019

https://doi.org/10.1016/j.microrel.2019.06.038 Ver en origen

• ISSN 0026-2714

• UC3M

Hardware Fault Injection. In: Soft Errors in Modern Electronic Systems

Soft Errors in Modern Electronic Systems (p. 141-166) - 11/2010

Editor: SPRINGER

https://doi.org/10.1007/978-1-4419-6993-4_6 Ver en origen

• ISBN 978-1-4419-6992-7

• UC3M

Low power consumption online testing technique for wearable wireless body area networks

37th Conference on Design of Circuits and Integrated Systems - DCIS 2022 - 2022

Editor: IEEE.THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, INC

10.1109/dcis55711.2022.9970190 Ver en origen

• ISBN 978-1-6654-5950-1

• UC3M

Evaluation of a multiprocessor system hardened with macro-synchronized lockstep with FreeRTOS OS using proton irradiation

IEEE Nuclear & Space Radiation Effects Conference (NSREC 2021) - 2021

• UC3M

Assessing SET Sensitivity of Mixed-Signal Circuits at Early Design Stages

2019 34th Conference on Design of Circuits and Integrated Systems, DCIS 2019 (p. 1-6) - 2020

Editor: IEEE.THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, INC

10.1109/dcis201949030.2019.8959892 Ver en origen

• ISBN 978-1-7281-5459-6

• UC3M

System Dependability in Edge Computing Wearable Devices

DCIS 2020 - 35th Conference on Design of Circuits and Integrated Systems Virtual Conference<br/> (p. 1-6) - 2020

Editor: IEEE.THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, INC

https://doi.org/10.1109/dcis51330.2020.9268674 Ver en origen

• ISBN 978-1-7281-9132-4

• UC3M

Embedded Emotion Recognition within Cyber-Physical Systems using Physiological Signals

Proceedings - 33rd Conference On Design Of Circuits And Integrated Systems, Dcis 2018 (p. 1-6) - 3/4/2019

Editor: Institute of Electrical and Electronics Engineers Inc.

10.1109/dcis.2018.8681496 Ver en origen

• ISBN 978-1-7281-0171-2
• ISSN/ISBN 9781728101712

• Dialnet
• iMarina
• iMarina
• UC3M

On-line testing of sensor networks: a case study

2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) (p. 201-202) - 2017

Editor: IEEE Service Center

https://doi.org/10.1109/iolts.2017.8046218 Ver en origen

• ISBN 978-1-5386-0351-2

• UC3M

Flexible approaches to fault-tolerant microprocessors for space aplications

DAta Systems In Aerospace (DASIA 2015) : The International Space System Engineering Conference - 2015

• UC3M

The Use of Benchmarks for High-Reliability Systems

11th IEEE Workshop on Silicon Errors in Logic - System Effects<br/>(SELSE 2015) - 2015

• UC3M

Verifying hardening techniques for distributed electronic systems in critical applications

15th European Conference onRadiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on - 2015

https://doi.org/10.1109/radecs.2015.7365695 Ver en origen

• UC3M

Assesing SET Sensitivity of PLL

Conference on Design of Circuits and Integrated Systems (DCIS) (p. 1-6) - 2014

Editor: IEEE INSTITUTE OF ELECTRICAL

• ISBN 978-1-4799-5743-9

• UC3M