In-depth multi-technique characterization of chromium-silicon mixedoxides produced by reactive ion beam mixing of the Cr/Si interface - Escobar Galindo, R.; Benito, N.; Duday, D.; Fuentes, G. G.; Valle, N.; Herrero, P.; Vergara, L.; Joco, V.; Sanchez, O.; Arranz, A.; Palacio, C.; (Journal Of Analytical Atomic Spectrometry, 2012)