Role of the SiO2 buffer layer thickness in the formation of Si/SiO2/nc-Ge/SiO2 structures by dry oxidation - Kling, A.; Ortiz, M. I.; Prieto, A. C.; Rodriguez, A.; Rodriguez, T.; Jimenez, J.; Ballesteros, C.; Soares, J. C.; (Nuclear Instruments & Methods In Physics Research Section B-Beam Interactions With Materials And Atoms, 2006)