Crack Origin and Detection in Thin Cristallyne Solar Cells in a Production Line - Sergei Ostapenko; Rubén Gutiérrez; Miguel Angel Vazquez; Juan Carlos Jimeno; Josu Barredo Egusquiza; Eneco Cereceda; Antonio Martínez; FRAILE DE LERMA, ALBERTO; ALARCON ALVAREZ, Enrique (2007)