Electron Channeling Contrast Imaging for the Characterization of Dislocations in III-V Thin Films on Silicon (001) - Monge-Bartolomé; L; Mouriño Miñambres; P; Peiro Codoñer; A; Sinusía Lozano; M; Yan; Z; García Vara; I; et al. (Physica Status Solidi A-Applications And Materials Science, 2026)