Low-to-Mid Al Content (x = 0?0.56) AlxIn1?xN Layers Deposited on Si(100) by Radio-Frequency Sputtering - Blasco, R.; Valdueza-Felip, S.; Montero, D.; Sun, M.; Olea, J.; Naranjo, F.B. (Physica Status Solidi (B) Basic Research, 2020)