Electron Beam Infrared Nano-Ellipsometry of Individual Indium Tin Oxide Nanocrystals - Olafsson, Agust; Busche, Jacob A.; Araujo, Jose J.; Maiti, Arpan; Idrobo, Juan Carlos; Gamelin, Daniel R.; Masiello, David J.; Camden, Jon P.; (Nano Letters, 2020)