RDF/XML JSON-LD N3/Turtle RDF/JSON

Castilla González, Elena María elena.castilla@urjc.es

Matemática Aplicada, Ciencia e Ingeniería de los Materiales y Tecnología Electrónica / Universidad Rey Juan Carlos

Actividades

Composite Likelihood Methods Based on Minimum Density Power Divergence Estimator

  • Castilla, Elena
  • Martin, Nirian
  • Pardo, Leandro
  • Zografos, Konstantinos;

Entropy - 1/1/2018

10.3390/e20010018 Ver en origen

  • ISSN 10994300

New robust statistical procedures for the polytomous logistic regression models

  • Castilla, Elena
  • Ghosh, Abhik
  • Martin, Nirian
  • Pardo, Leandro;

Biometrics (p. 1282-1291) - 1/12/2018

10.1111/biom.12890 Ver en origen

  • ISSN 0006341X

Minimum phi-divergence estimators for multinomial logistic regression with complex sample design

  • Castilla, Elena
  • Martin, Nirian
  • Pardo, Leandro;

Asta-Advances In Statistical Analysis (p. 381-411) - 1/7/2018

10.1007/s10182-017-0311-6 Ver en origen

  • ISSN 18638171

Robust estimators for one-shot device testing data under gamma lifetime model with an application to a tumor toxicological data

  • Balakrishnan, N.
  • Castilla, E.
  • Martin, N.
  • Pardo, L.;

Metrika (p. 991-1019) - 1/11/2019

10.1007/s00184-019-00718-5 Ver en origen

  • ISSN 00261335

Robust Estimators and Test Statistics for One-Shot Device Testing Under the Exponential Distribution

  • Balakrishnan, Narayanaswamy
  • Castilla, Elena
  • Martin, Nirian
  • Pardo, Leandro;

Ieee Transactions On Information Theory (p. 3080-3096) - 1/5/2019

10.1109/tit.2019.2903244 Ver en origen

  • ISSN 00189448

Model Selection in a Composite Likelihood Framework Based on Density Power Divergence

  • Castilla, Elena
  • Martin, Nirian
  • Pardo, Leandro
  • Zografos, Konstantinos;

Entropy - 1/3/2020

10.3390/e22030270 Ver en origen

  • ISSN 10994300

Robust inference for one-shot device testing data under exponential lifetime model with multiple stresses

  • Balakrishnan, Narayanaswamy
  • Castilla, Elena
  • Martin, Nirian
  • Pardo, Leandro;

Quality And Reliability Engineering International (p. 1916-1930) - 20/5/2020

10.1002/qre.2665 Ver en origen

  • ISSN 10991638

Robust Wald-type tests based on minimum Renyi pseudodistance estimators for the multiple linear regression model

  • Castilla, E.
  • Martin, N.
  • Munoz, S.
  • Pardo, L.;

Journal Of Statistical Computation And Simulation (p. 2655-2680) - 4/7/2020

10.1080/00949655.2020.1787410 Ver en origen

  • ISSN 00949655

Robust Inference for One-Shot Device Testing Data Under Weibull Lifetime Model

  • Balakrishnan, Narayanaswamy
  • Castilla, Elena
  • Martin, Nirian
  • Pardo, Leandro;

Ieee Transactions On Reliability (p. 937-953) - 1/9/2020

10.1109/tr.2019.2954385 Ver en origen

  • ISSN 00189529

Testing linear hypotheses in logistic regression analysis with complex sample survey data based on phi-divergence measures

  • Castilla, E.
  • Martin, N.
  • Pardo, L.;

Communications In Statistics-Theory And Methods (p. 5228-5247) - 1/1/2021

10.1080/03610926.2020.1746342 Ver en origen

  • ISSN 1532415X

Este/a investigador/a no tiene libros.

A Logistic Regression Analysis Approach for Sample Survey Data Based on Phi-Divergence Measures

  • Castilla, Elena
  • Martin, Nirian
  • Pardo, Leandro;

Studies In Systems, Decision And Control (p. 465-474) - 1/1/2018

10.1007/978-3-319-73848-2_43 Ver en origen

  • ISSN 21984190

On the Choice of the Optimal Tuning Parameter in Robust One-Shot Device Testing Analysis

  • Castilla E
  • Chocano PJ

Studies In Systems, Decision And Control (p. 169-180) - 1/1/2023

10.1007/978-3-031-04137-2_16 Ver en origen

  • ISSN 21984190

Este/a investigador/a no tiene congresos.

Este/a investigador/a no tiene documentos de trabajo.

Este/a investigador/a no tiene informes técnicos.

Este/a investigador/a no tiene proyectos de investigación.

Este/a investigador/a no tiene tesis dirigidas.

Este/a investigador/a no tiene patentes o licencias de software.

Última actualización de los datos: 14/07/23 14:02