Castilla González, Elena María elena.castilla@urjc.es
Actividades
- Artículos 21
- Libros 0
- Capítulos de libro 2
- Congresos 0
- Documentos de trabajo 0
- Informes técnicos 0
- Proyectos de investigación 0
- Tesis dirigidas 0
- Patentes o licencias de software 0
Optimal designs of constant-stress accelerated life-tests for one-shot devices with model misspecification analysis
- Balakrishnan, Narayanaswamy
- Castilla, Elena
- Ling, Man Ho;
Quality And Reliability Engineering International (p. 989-1012) - 1/1/2022
10.1002/qre.3031 Ver en origen
- ISSN 10991638
Power divergence approach for one-shot device testing under competing risks
- Balakrishnan N
- Castilla E
- Martin N
- Pardo L
Journal Of Computational And Applied Mathematics - 1/2/2023
10.1016/j.cam.2022.114676 Ver en origen
- ISSN 03770427
Robust Estimators and Test Statistics for One-Shot Device Testing Under the Exponential Distribution
- Balakrishnan, Narayanaswamy
- Castilla, Elena
- Martin, Nirian
- Pardo, Leandro;
Ieee Transactions On Information Theory (p. 3080-3096) - 1/5/2019
10.1109/tit.2019.2903244 Ver en origen
- ISSN 00189448
Robust Inference for One-Shot Device Testing Data Under Weibull Lifetime Model
- Balakrishnan, Narayanaswamy
- Castilla, Elena
- Martin, Nirian
- Pardo, Leandro;
Ieee Transactions On Reliability (p. 937-953) - 1/9/2020
10.1109/tr.2019.2954385 Ver en origen
- ISSN 00189529
Robust Wald-type tests based on minimum Renyi pseudodistance estimators for the multiple linear regression model
- Castilla, E.
- Martin, N.
- Munoz, S.
- Pardo, L.;
Journal Of Statistical Computation And Simulation (p. 2655-2680) - 4/7/2020
10.1080/00949655.2020.1787410 Ver en origen
- ISSN 00949655
Robust approach for comparing two dependent normal populations through Wald-type tests based on Renyi's pseudodistance estimators
- Castilla, Elena
- Jaenada, Maria
- Martin, Nirian
- Pardo, Leandro;
Statistics And Computing - 1/12/2022
10.1007/s11222-022-10162-7 Ver en origen
- ISSN 09603174
Robust estimators for one-shot device testing data under gamma lifetime model with an application to a tumor toxicological data
- Balakrishnan, N.
- Castilla, E.
- Martin, N.
- Pardo, L.;
Metrika (p. 991-1019) - 1/11/2019
10.1007/s00184-019-00718-5 Ver en origen
- ISSN 00261335
Robust inference for nondestructive one-shot device testing under step-stress model with exponential lifetimes
- Balakrishnan, Narayanaswamy
- Castilla, Elena
- Jaenada, Maria
- Pardo, Leandro;
Quality And Reliability Engineering International (p. 1192-1222) - 16/2/2023
10.1002/qre.3287 Ver en origen
- ISSN 10991638
Robust inference for one-shot device testing data under exponential lifetime model with multiple stresses
- Balakrishnan, Narayanaswamy
- Castilla, Elena
- Martin, Nirian
- Pardo, Leandro;
Quality And Reliability Engineering International (p. 1916-1930) - 20/5/2020
10.1002/qre.2665 Ver en origen
- ISSN 10991638
Robust semiparametric inference for polytomous logistic regression with complex survey design
- Castilla, Elena
- Ghosh, Abhik
- Martin, Nirian
- Pardo, Leandro;
Advances In Data Analysis And Classification (p. 701-734) - 1/1/2021
10.1007/s11634-020-00430-7 Ver en origen
- ISSN 18625347
Este/a investigador/a no tiene libros.
A Logistic Regression Analysis Approach for Sample Survey Data Based on Phi-Divergence Measures
- Castilla, Elena
- Martin, Nirian
- Pardo, Leandro;
Studies In Systems, Decision And Control (p. 465-474) - 1/1/2018
10.1007/978-3-319-73848-2_43 Ver en origen
- ISSN 21984190
On the Choice of the Optimal Tuning Parameter in Robust One-Shot Device Testing Analysis
- Castilla E
- Chocano PJ
Studies In Systems, Decision And Control (p. 169-180) - 1/1/2023
10.1007/978-3-031-04137-2_16 Ver en origen
- ISSN 21984190
Este/a investigador/a no tiene congresos.
Este/a investigador/a no tiene documentos de trabajo.
Este/a investigador/a no tiene informes técnicos.
Este/a investigador/a no tiene proyectos de investigación.
Este/a investigador/a no tiene tesis dirigidas.
Este/a investigador/a no tiene patentes o licencias de software.
Perfiles de investigador/a
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ORCID
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