Castilla González, Elena María elena.castilla@urjc.es
Publications
- Articles 21
- Books 0
- Book chapters 2
- Conferences 0
- Working papers 0
- Technical reports 0
- Research projects 0
- Supervised theses 0
- Patent or software license 0
Optimal designs of constant-stress accelerated life-tests for one-shot devices with model misspecification analysis
- Balakrishnan, Narayanaswamy
- Castilla, Elena
- Ling, Man Ho;
Quality And Reliability Engineering International (p. 989-1012) - 1/1/2022
10.1002/qre.3031 View at source
- ISSN 10991638
Power divergence approach for one-shot device testing under competing risks
- Balakrishnan N
- Castilla E
- Martin N
- Pardo L
Journal Of Computational And Applied Mathematics - 1/2/2023
10.1016/j.cam.2022.114676 View at source
- ISSN 03770427
Robust Estimators and Test Statistics for One-Shot Device Testing Under the Exponential Distribution
- Balakrishnan, Narayanaswamy
- Castilla, Elena
- Martin, Nirian
- Pardo, Leandro;
Ieee Transactions On Information Theory (p. 3080-3096) - 1/5/2019
10.1109/tit.2019.2903244 View at source
- ISSN 00189448
Robust Inference for One-Shot Device Testing Data Under Weibull Lifetime Model
- Balakrishnan, Narayanaswamy
- Castilla, Elena
- Martin, Nirian
- Pardo, Leandro;
Ieee Transactions On Reliability (p. 937-953) - 1/9/2020
10.1109/tr.2019.2954385 View at source
- ISSN 00189529
Robust Wald-type tests based on minimum Renyi pseudodistance estimators for the multiple linear regression model
- Castilla, E.
- Martin, N.
- Munoz, S.
- Pardo, L.;
Journal Of Statistical Computation And Simulation (p. 2655-2680) - 4/7/2020
10.1080/00949655.2020.1787410 View at source
- ISSN 00949655
Robust approach for comparing two dependent normal populations through Wald-type tests based on Renyi's pseudodistance estimators
- Castilla, Elena
- Jaenada, Maria
- Martin, Nirian
- Pardo, Leandro;
Statistics And Computing - 1/12/2022
10.1007/s11222-022-10162-7 View at source
- ISSN 09603174
Robust estimators for one-shot device testing data under gamma lifetime model with an application to a tumor toxicological data
- Balakrishnan, N.
- Castilla, E.
- Martin, N.
- Pardo, L.;
Metrika (p. 991-1019) - 1/11/2019
10.1007/s00184-019-00718-5 View at source
- ISSN 00261335
Robust inference for nondestructive one-shot device testing under step-stress model with exponential lifetimes
- Balakrishnan, Narayanaswamy
- Castilla, Elena
- Jaenada, Maria
- Pardo, Leandro;
Quality And Reliability Engineering International (p. 1192-1222) - 16/2/2023
10.1002/qre.3287 View at source
- ISSN 10991638
Robust inference for one-shot device testing data under exponential lifetime model with multiple stresses
- Balakrishnan, Narayanaswamy
- Castilla, Elena
- Martin, Nirian
- Pardo, Leandro;
Quality And Reliability Engineering International (p. 1916-1930) - 20/5/2020
10.1002/qre.2665 View at source
- ISSN 10991638
Robust semiparametric inference for polytomous logistic regression with complex survey design
- Castilla, Elena
- Ghosh, Abhik
- Martin, Nirian
- Pardo, Leandro;
Advances In Data Analysis And Classification (p. 701-734) - 1/1/2021
10.1007/s11634-020-00430-7 View at source
- ISSN 18625347
This researcher has no books.
A Logistic Regression Analysis Approach for Sample Survey Data Based on Phi-Divergence Measures
- Castilla, Elena
- Martin, Nirian
- Pardo, Leandro;
Studies In Systems, Decision And Control (p. 465-474) - 1/1/2018
10.1007/978-3-319-73848-2_43 View at source
- ISSN 21984190
On the Choice of the Optimal Tuning Parameter in Robust One-Shot Device Testing Analysis
- Castilla E
- Chocano PJ
Studies In Systems, Decision And Control (p. 169-180) - 1/1/2023
10.1007/978-3-031-04137-2_16 View at source
- ISSN 21984190
This researcher has no conferences.
This researcher has no working papers.
This researcher has no technical reports.
This researcher has no research projects.
This researcher has no supervised thesis.
This researcher has no patents or software licenses.
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