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Author profile at the institutional portal

Nuñez Mendoza, Neftali neftali.nunez@upm.es

ELECTRÓNICA FÍSICA, INGENIERÍA ELÉCTRICA Y FÍSICA APLICADA / Universidad Politécnica de Madrid

Publications

High-power UV-LED degradation: Continuous and cycled working condition influence

  • Arques-Orobon F
  • Nuñez N
  • Vazquez M
  • Segura-Antunez C
  • González-Posadas V

Solid-State Electronics (p. 111-117) - 13/6/2015

10.1016/j.sse.2015.05.039 View at source

  • ISSN 00381101

Estimation of activation energy and reliability figures of space lattice-matched GaInP/Ga(In)As/Ge triple junction solar cells from Temperature Accelerated Life Tests

  • Nuñez, N
  • Vazquez, M
  • Barrutia, L
  • Bautista, J
  • Lombardero, I
  • Zamorano, JC
  • Hinojosa, M
  • Gabas, M
  • Algora, C
... View more Collapse

Solar Energy Materials And Solar Cells - 1/1/2021

10.1016/j.solmat.2021.111211 View at source

  • ISSN 09270248

Estimation of the reliability figures of space GaInP/Ga(In)As/Ge triple junction solar cells from very high temperature accelerated life tests with forward and reverse biasing

  • Nuñez, N
  • Vazquez, M
  • Martín, P
  • Bautista, J
  • Hinojosa, M
  • Algora, C

Solar Energy Materials And Solar Cells - 15/8/2023

10.1016/j.solmat.2023.112454 View at source

  • ISSN 09270248

Functional analysis in long-term operation of high power UV-LEDS in continuous fluoro-sensing systems for hydrocarbon pollution

  • Arques-Orobon F
  • Nuñez N
  • Vazquez M
  • Gonzalez-Posadas V

Sensors - 26/2/2016

10.3390/s16030293 View at source

  • ISSN 14248220

Processing Fluorescence Spectra for Pollutants Detection Systems in Inland Waters

  • Arques-Orobon FJ
  • Prieto-Castrillo F
  • Nuñez N
  • Gonzalez-Posadas V

Sensors - 1/6/2020

10.3390/s20113102 View at source

  • ISSN 14248220

Instrumentation for accelerated life tests of concentrator solar cells

  • Núñez N
  • Vázquez M
  • González J
  • Jiménez F
  • Bautista J

Review Of Scientific Instruments - 1/1/2011

10.1063/1.3541800 View at source

  • ISSN 00346748

Semi-quantitative temperature accelerated life test (ALT) for the reliability qualification of concentrator solar cells and cell on carriers

  • Nuñez N
  • Vazquez M
  • Orlando V
  • Espinet-González P
  • Algora C

Progress In Photovoltaics (p. 1857-1866) - 1/12/2015

10.1002/pip.2631 View at source

  • ISSN 10627995

Warranty assessment of photovoltaic modules based on a degradation probabilistic model

  • Prieto-Castrillo F
  • Núñez N
  • Vázquez M

Progress In Photovoltaics (p. 1308-1321) - 1/12/2020

10.1002/pip.3328 View at source

  • ISSN 10627995

Temperature Accelerated Life Test and Failure Analysis on Upright Metamorphic Ga0.37In0.63P/Ga0.83In0.17As/Ge Triple Junction Solar Cells

  • Orlando, V
  • Lombardero, I
  • Gabás, M
  • Nuñez, N
  • Vázquez, M
  • Espinet-González, P
  • Bautista, J
  • Romero, R
  • Algora, C
... View more Collapse

Progress In Photovoltaics (p. 148-166) - 1/2/2020

10.1002/pip.3223 View at source

  • ISSN 10627995

Evaluation of the reliability of high concentrator GaAs solar cells by means of temperature accelerated aging tests

  • Núñez N
  • González J
  • Vázquez M
  • Algora C
  • Espinet P

Progress In Photovoltaics (p. 1104-1113) - 1/8/2013

10.1002/pip.2212 View at source

  • ISSN 10627995

This researcher has no books.

This researcher has no book chapters.

III-V high concentrator solar cells: assessing the reliability of a new product

  • José Ramón González Ciprián
  • Carlos Algora Del Valle
  • Ignacio Rey-Stolle Prado
  • Manuel Vázquez
  • Neftalí Nuñez
  • Beatriz Galiana Blanco
  • Iván García Vara
  • Juán Barbero
  • Vicente Díaz Luque
... View more Collapse

(p. 9-12) - 12/3/2007

  • iMarina

Reliability evaluation of III-V Concentrator solar cells

  • José R. González
  • Nuñez Mendoza, Neftali
  • Rey-Stolle Prado, Ignacio
  • Algora del Valle, Carlos
  • Vazquez Lopez, Manuel

Safety, Reliability And Risk Analysis: Theory, Methods And Applications - Proceedings Of The Joint Esrel And Sra-Europe Conference (p. 1949-1953) - 1/12/2009

  • ISSN 00010782
  • iMarina

Evaluation of the reliability of space solar cells by means of Sequential Accelerated Life Tests

  • Manuel Vázquez
  • Neftalí Nuñez
  • Carlos Algora

Proceedings (p. 0-6) - 30/9/2019

10.1109/espc.2019.8931981 View at source

Innovative Temperature Accelerated Life Test for the determination of the activation energy of space solar cells

  • Nuñez, N
  • Vazquez, M
  • Barrutia, L
  • Bautista, J
  • Lombardero, I
  • Zamorano, JC
  • Hinojosa, M
  • Gabas, M
  • Algora, C
... View more Collapse

Proceedings (p. 0-6) - 30/9/2019

10.1109/espc.2019.8931993 View at source

Sistema de Instrumentación de Ensayos Acelerados para Evaluar la Fiabilidad de Dispositivos Semiconductores III-V a Partir de Datos de Degradación

  • J.R. González
  • E. Pérez
  • Nuñez Mendoza, Neftali
  • Algora del Valle, Carlos
  • Vazquez Lopez, Manuel

Proceedings (p. 1-12) - 3/6/2009

  • iMarina

Degradation mechanism analysis in temperature stress tests on III-V ultra-high concentrator solar cells using a 3D distributed model

  • Espinet P
  • Algora C
  • González J
  • Núnez N
  • Vázquez M

Microelectronics Reliability (p. 1875-1879) - 1/1/2010

10.1016/j.microrel.2010.07.128 View at source

  • ISSN 00262714

Degradation of AlInGaP red LEDs under drive current and temperature accelerated life tests

  • Vázquez M
  • Núñez N
  • Nogueira E
  • Borreguero A

Microelectronics Reliability (p. 1559-1562) - 1/1/2010

10.1016/j.microrel.2010.07.057 View at source

  • ISSN 00262714

UV LEDs reliability tests for fluoro-sensing sensor application

  • Arques-Orobon F
  • Nuñez N
  • Vazquez M
  • González-Posadas V

Microelectronics Reliability (p. 2154-2158) - 1/9/2014

10.1016/j.microrel.2014.07.059 View at source

  • ISSN 00262714

Novel accelerated testing method for III-V concentrator solar cells

  • Núñez N
  • Vázquez M
  • González J
  • Algora C
  • Espinet P

Microelectronics Reliability (p. 1880-1883) - 1/1/2010

10.1016/j.microrel.2010.07.085 View at source

  • ISSN 00262714

Evaluation of the reliability of commercial concentrator triple-junction solar cells by means of Accelerated Life Tests (ALT)

  • Espinet-González P
  • Algora C
  • Núñez N
  • Orlando V
  • Vázquez M
  • Bautista J
  • Araki K
... View more Collapse

Evaluation Of The Reliability Of Commercial Concentrator Triple-Junction Solar Cells By Means Of Accelerated Life Tests (Alt) (p. 222-225) - 15/4/2013

10.1063/1.4822236 View at source

  • ISSN 15517616

This researcher has no working papers.

This researcher has no technical reports.

THESEUS - Células Solares Tandem de Alta Eficiencia Utilizando Semiconductores III-V sobre Silicio

  • Ignacio Rey-Stolle Prado (Investigador principal (IP))
  • García Vara, Iván (Investigador/a)

Period: 01-05-2015 - 31-12-2017

Type of funding: National

Amount of funding: 75000,00 Euros.

  • iMarina

Validación de HP UV-LED para la detección en continuo de contaminantes en aguas continentales mediante fluorescencia

  • Gonzalez Posadas, Vicente (Director)
  • Nuñez Mendoza, Neftali (Director) Doctorando: Arqués Orobón, Francisco José

1/1/2016

  • iMarina

Análisis de fiabilidad de leds de AlInGaP de alta eficiencia luminosa

  • Vazquez Lopez, Manuel (Director)
  • Nuñez Mendoza, Neftali (Director) Doctorando: Nogueira Díaz, Eduardo

1/10/2013

  • iMarina

This researcher has no patents or software licenses.

Last data update: 4/8/24 9:07 AM