Solar Energy Harvesting to Improve Capabilities of Wearable Devices

Sensors (p. 3950-3971) - 5/2022

https://doi.org/10.3390/s22103950 Ver en origen

• EISSN 1424-8220
• ISSN 1424-3210

• UC3M

On the use of embedded debug features for permanent and transient fault resilience in microprocessors

MICROPROCESSORS AND MICROSYSTEMS (p. 334-343) - 7/2012

https://doi.org/10.1016/j.micpro.2012.02.013 Ver en origen

• ISSN 0141-9331

• UC3M

Analysis of neutron sensitivity and data-flow error detection in ARM microprocessors using NEON SIMD extensions

MICROELECTRONICS RELIABILITY (p. 113346) - 9/2019

https://doi.org/10.1016/j.microrel.2019.06.038 Ver en origen

• ISSN 0026-2714

• UC3M

PTM-based hybrid error-detection architecture for ARM microprocessors

MICROELECTRONICS RELIABILITY (p. 925-930) - 9/2018

https://doi.org/10.1016/j.microrel.2018.07.074 Ver en origen

• ISSN 0026-2714

• UC3M

Error sensitivity study of FFT architectures implemented in FPGA

MICROELECTRONICS RELIABILITY (p. 1-5) - 11/2021

https://doi.org/10.1016/j.microrel.2021.114298 Ver en origen

• ISSN 0026-2714

• UC3M

Dual-Core Lockstep enhanced with redundant multithread support and control-flow error detection

MICROELECTRONICS RELIABILITY (p. 113447) - 9/2019

https://doi.org/10.1016/j.microrel.2019.113447 Ver en origen

• ISSN 0026-2714

• UC3M

SET Emulation under a Quantized Delay Model

JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS (p. 107-116) - 2/2009

https://doi.org/10.1007/s10836-008-5081-3 Ver en origen

• EISSN 1573-0727
• ISSN 0923-8174

• UC3M

Evaluating the Effectiveness of a Software-Based Technique Under SEEs Using FPGA-Based Fault Injection Approach

JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS (p. 777-789) - 12/2012

https://doi.org/10.1007/s10836-012-5321-4 Ver en origen

• EISSN 1573-0727
• ISSN 0923-8174

• UC3M

Fault Injection in Modern Microprocessors Using On-Chip Debugging Infrastructures

IEEE Transactions on Dependable and Secure Computing (p. 308-314) - 3/2011

https://doi.org/10.1109/tdsc.2010.50 Ver en origen

• EISSN 1941-0018
• ISSN 1545-5971

• UC3M

Online error detection through trace infrastructure in ARM microprocessors

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 1457-1464) - 7/2019

https://doi.org/10.1109/tns.2019.2921767 Ver en origen

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

Hardware Fault Injection. In: Soft Errors in Modern Electronic Systems

Soft Errors in Modern Electronic Systems (p. 141-166) - 11/2010

Editor: SPRINGER

https://doi.org/10.1007/978-1-4419-6993-4_6 Ver en origen

• ISBN 978-1-4419-6992-7

• UC3M

Approximate logic functions for SET mitigation in sequential circuits

XXVII International Conference on Design of Circuits and Integrated Circuits (DCIS 2012) (p. 195-200) - 2012

• ISBN 978295174614

• UC3M

SET Fault Injection Attacks on a Hardware Implementation of the SHA Cypher

XXVII Design of Circuits and Integrated Systems (DCIS 2012) - 2012

• UC3M

FPGA-based implementation for steganalysis: a JPEG-compatibility algorithm

SPIE 2013 Microtechnologies. VI Conference on VLSI Circuits and Systems - 2013

Editor: SPIE- THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING

https://doi.org/10.1117/12.2017476 Ver en origen

• ISBN 978-0-8194-9561-7

• UC3M

Extensive SEU impact analysis of a PIC microprocessor for selective hardening

Radiation Effects on Components and Systems Workshop (RADECS) (p. 1986-1991) - 2010

Editor: IEEE INTERNATIONAL LLC

https://doi.org/10.1109/tns.2009.2039581 Ver en origen

• ISBN 1558-1578

• UC3M

Sensitivity Evaluation Method for Aerospace Digital Systems with Collaborative Hardening

Radiation Effects on Components and Systems Workshop (RADECS) (p. 1053-1058) - 2011

Editor: IEEE INTERNATIONAL LLC

https://doi.org/10.1109/tns.2011.2109397 Ver en origen

• ISBN 9781457705854

• UC3M

Embedded Emotion Recognition within Cyber-Physical Systems using Physiological Signals

Proceedings - 33rd Conference On Design Of Circuits And Integrated Systems, Dcis 2018 (p. 1-6) - 3/4/2019

Editor: Institute of Electrical and Electronics Engineers Inc.

10.1109/dcis.2018.8681496 Ver en origen

• ISBN 978-1-7281-0171-2
• ISSN/ISBN 9781728101712

• Dialnet
• iMarina
• iMarina
• UC3M

Redundancia temporal configurable para algoritmos criptográficos robustos

Jornadas de Computación Reconfigurable - 2008

• UC3M

Evaluation of a multiprocessor system hardened with macro-synchronized lockstep with FreeRTOS OS using proton irradiation

IEEE Nuclear & Space Radiation Effects Conference (NSREC 2021) - 2021

• UC3M

System Dependability in Edge Computing Wearable Devices

DCIS 2020 - 35th Conference on Design of Circuits and Integrated Systems Virtual Conference<br/> (p. 1-6) - 2020

Editor: IEEE.THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, INC

https://doi.org/10.1109/dcis51330.2020.9268674 Ver en origen

• ISBN 978-1-7281-9132-4

• UC3M

Flexible approaches to fault-tolerant microprocessors for space aplications

DAta Systems In Aerospace (DASIA 2015) : The International Space System Engineering Conference - 2015

• UC3M