SET Emulation under a Quantized Delay Model

JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS (p. 107-116) - 2/2009

https://doi.org/10.1007/s10836-008-5081-3 Ver en origen

• EISSN 1573-0727
• ISSN 0923-8174

• UC3M

Analysis of Turbo Decoder Robustness Against SEU Effects

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 2184-2188) - 8/2009

https://doi.org/10.1109/tns.2009.2018270 Ver en origen

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

SET Emulation Considering Electrical Masking Effects

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 2015-2021) - 8/2009

https://doi.org/10.1109/tns.2009.2013346 Ver en origen

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

Fault Injection in Modern Microprocessors Using On-Chip Debugging Infrastructures

IEEE Transactions on Dependable and Secure Computing (p. 308-314) - 3/2011

https://doi.org/10.1109/tdsc.2010.50 Ver en origen

• EISSN 1941-0018
• ISSN 1545-5971

• UC3M

Analysis of SET effects in a PIC microprocessor for selective hardening

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 1078-1085) - 6/2011

https://doi.org/10.1109/tns.2010.2096433 Ver en origen

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

Evaluating the Effectiveness of a Software-Based Technique Under SEEs Using FPGA-Based Fault Injection Approach

JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS (p. 777-789) - 12/2012

https://doi.org/10.1007/s10836-012-5321-4 Ver en origen

• EISSN 1573-0727
• ISSN 0923-8174

• UC3M

Soft Error Sensitivity Evaluation of Microprocessors by Multilevel Emulation-Based Fault Injection

IEEE TRANSACTIONS ON COMPUTERS (p. 313-322) - 3/2012

https://doi.org/10.1109/tc.2010.262 Ver en origen

• EISSN 1557-9956
• ISSN 0018-9340

• UC3M

On the use of embedded debug features for permanent and transient fault resilience in microprocessors

MICROPROCESSORS AND MICROSYSTEMS (p. 334-343) - 7/2012

https://doi.org/10.1016/j.micpro.2012.02.013 Ver en origen

• ISSN 0141-9331

• UC3M

Using Benchmarks for Radiation Testing of Microprocessors and FPGAs

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 2547-2554) - 12/2015

https://doi.org/10.1109/tns.2015.2498313 Ver en origen

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

Partial TMR in FPGAs Using Approximate Logic Circuits

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 2233-2240) - 8/2016

https://doi.org/10.1109/tns.2016.2541700 Ver en origen

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

Hardware Fault Injection. In: Soft Errors in Modern Electronic Systems

Soft Errors in Modern Electronic Systems (p. 141-166) - 11/2010

Editor: SPRINGER

https://doi.org/10.1007/978-1-4419-6993-4_6 Ver en origen

• ISBN 978-1-4419-6992-7

• UC3M

Redundancia temporal configurable para algoritmos criptográficos robustos

Jornadas de Computación Reconfigurable - 2008

• UC3M

Smart Hardening for Round-based Encryption Algoritms: Application to Advanced Encryptijon Standard

14th IEEE International On-Line Testing Symposium (IOLTS) - 2008

• UC3M

The Effects of Proton Irradiation on CoolRunner-II CPLD Technology

8th European Workshop on Radiation Effects on Components and Systems - 2008

• UC3M

SET Emulation Considering Electrical Masking Effects

8th European Workshop on Radiation Effects on Components and Systems - 2008

• UC3M

Analysis of Turbo Decoder Robustness Against SEU Effects

8th European Workshop on Radiation Effects on Components and Systems (RADECS 2008) - 2008

• UC3M

Extensive SEU impact analysis of a PIC microprocessor for selective hardening

Radiation Effects on Components and Systems Workshop (RADECS) (p. 1986-1991) - 2010

Editor: IEEE INTERNATIONAL LLC

https://doi.org/10.1109/tns.2009.2039581 Ver en origen

• ISBN 1558-1578

• UC3M

Using an FPGA-Based Fault Injection Technique to Evaluate Software Robustness Under SEEs: A Case Study

12th Latin American test Workshop (LATW 2011) - 2011

Editor: IEEE - THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, INC

• ISBN 978-1-4577-1489-4

• UC3M

Sensitivity Evaluation Method for Aerospace Digital Systems with Collaborative Hardening

Radiation Effects on Components and Systems Workshop (RADECS) (p. 1053-1058) - 2011

Editor: IEEE INTERNATIONAL LLC

https://doi.org/10.1109/tns.2011.2109397 Ver en origen

• ISBN 9781457705854

• UC3M

Study on the Effect of Multiple Errors in Robust Systems Based on Critical Task Distribution

2011 12th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (p. 463-466) - 2011

Editor: IEEE - THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, INC

• ISBN 978-1-4577-0585-4

• UC3M

A Recovery Mechanism for SET Protection Using Standard-Cells

2011 12th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (p. 128-131) - 2011

Editor: IEEE - THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, INC

• ISBN 978-1-4577-0585-4

• UC3M