A hybrid fault-tolerant LEON3 soft core processor implemented in low-end SRAM FPGA

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 374-381) - 1/2017

https://doi.org/10.1109/tns.2016.2636574 Ver en origen

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

Analysis of SET effects in a PIC microprocessor for selective hardening

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 1078-1085) - 6/2011

https://doi.org/10.1109/tns.2010.2096433 Ver en origen

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

Analysis of Turbo Decoder Robustness Against SEU Effects

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 2184-2188) - 8/2009

https://doi.org/10.1109/tns.2009.2018270 Ver en origen

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

Analysis of neutron sensitivity and data-flow error detection in ARM microprocessors using NEON SIMD extensions

MICROELECTRONICS RELIABILITY (p. 113346) - 9/2019

https://doi.org/10.1016/j.microrel.2019.06.038 Ver en origen

• ISSN 0026-2714

• UC3M

Analyzing Reduced Precision Triple Modular Redundancy under Proton Irradiation

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 470-477) - 3/2022

https://doi.org/10.1109/tns.2022.3152088 Ver en origen

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

Analyzing Scaled Reduced Precision Redundancy for Error Mitigation under Proton Irradiation

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 1485-1491) - 7/2022

https://doi.org/10.1109/tns.2022.3147599 Ver en origen

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

Comparison of parallel implementation strategies in GPU-accelerated System-on-Chip under proton irradiation

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 444-452) - 3/2022

10.1109/tns.2021.3128722 Ver en origen

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

Dual-Core Lockstep enhanced with redundant multithread support and control-flow error detection

MICROELECTRONICS RELIABILITY (p. 113447) - 9/2019

https://doi.org/10.1016/j.microrel.2019.113447 Ver en origen

• ISSN 0026-2714

• UC3M

Error Detection and Mitigation of Data-Intensive Microprocessor Applications Using SIMD and Trace Monitoring

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 1452-1460) - 7/2020

https://doi.org/10.1109/tns.2020.2992299 Ver en origen

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

Error sensitivity study of FFT architectures implemented in FPGA

MICROELECTRONICS RELIABILITY (p. 1-5) - 11/2021

https://doi.org/10.1016/j.microrel.2021.114298 Ver en origen

• ISSN 0026-2714

• UC3M

Hardware Fault Injection. In: Soft Errors in Modern Electronic Systems

Soft Errors in Modern Electronic Systems (p. 141-166) - 11/2010

Editor: SPRINGER

https://doi.org/10.1007/978-1-4419-6993-4_6 Ver en origen

• ISBN 978-1-4419-6992-7

• UC3M

A Recovery Mechanism for SET Protection Using Standard-Cells

2011 12th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (p. 128-131) - 2011

Editor: IEEE - THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, INC

• ISBN 978-1-4577-0585-4

• UC3M

A method to assess the robustness of cryptographic circuits at the design stage

27th Conference on Design of Circuits and Integrated Systems (DCIS 2012) (p. 1354-1360) - 2014

Editor: ELSEVIER B.V.

https://doi.org/10.1016/j.mejo.2013.12.012 Ver en origen

• UC3M

Analysis of Turbo Decoder Robustness Against SEU Effects

8th European Workshop on Radiation Effects on Components and Systems (RADECS 2008) - 2008

• UC3M

Approximate logic functions for SET mitigation in sequential circuits

XXVII International Conference on Design of Circuits and Integrated Circuits (DCIS 2012) (p. 195-200) - 2012

• ISBN 978295174614

• UC3M

Assesing SET Sensitivity of PLL

Conference on Design of Circuits and Integrated Systems (DCIS) (p. 1-6) - 2014

Editor: IEEE INSTITUTE OF ELECTRICAL

• ISBN 978-1-4799-5743-9

• UC3M

Assessing SET Sensitivity of Mixed-Signal Circuits at Early Design Stages

2019 34th Conference on Design of Circuits and Integrated Systems, DCIS 2019 (p. 1-6) - 2020

Editor: IEEE.THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, INC

10.1109/dcis201949030.2019.8959892 Ver en origen

• ISBN 978-1-7281-5459-6

• UC3M

Assessing SET sensitivity of a PLL

2014 Conference on Design of Circuits and Integrated Circuits (DCIS) (p. 1-6) - 2014

Editor: IEEE Computer Society.

https://doi.org/10.1109/dcis.2014.7035582 Ver en origen

• UC3M

C-Element model for SET fault emulation

14th Radiation Effects on Components and Systems (RADECS 2013) (p. 1-4) - 2013

Editor: IEEE - THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, INC

https://doi.org/10.1109/radecs.2013.6937389 Ver en origen

• ISBN 978-1-4673-5057-0

• UC3M

Embedded Emotion Recognition within Cyber-Physical Systems using Physiological Signals

Proceedings - 33rd Conference On Design Of Circuits And Integrated Systems, Dcis 2018 (p. 1-6) - 3/4/2019

Editor: Institute of Electrical and Electronics Engineers Inc.

10.1109/dcis.2018.8681496 Ver en origen

• ISBN 978-1-7281-0171-2
• ISSN/ISBN 9781728101712

• Dialnet
• iMarina
• iMarina
• UC3M

Error masking with approximate logic circuits using dynamic probability estimations

2014 IEEE 20th International On-Line Testing Symposium (IOLTS) (p. 134-139) - 2014

Editor: IEEE Computer Society.

https://doi.org/10.1109/iolts.2014.6873685 Ver en origen

• UC3M