Soft Error Sensitivity Evaluation of Microprocessors by Multilevel Emulation-Based Fault Injection

IEEE TRANSACTIONS ON COMPUTERS (p. 313-322) - 3/2012

https://doi.org/10.1109/tc.2010.262 Ver en origen

• EISSN 1557-9956
• ISSN 0018-9340

• UC3M

SET Emulation under a Quantized Delay Model

JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS (p. 107-116) - 2/2009

https://doi.org/10.1007/s10836-008-5081-3 Ver en origen

• EISSN 1573-0727
• ISSN 0923-8174

• UC3M

SET Emulation Considering Electrical Masking Effects

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 2015-2021) - 8/2009

https://doi.org/10.1109/tns.2009.2013346 Ver en origen

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

Optimized Design and Implementation of Digital Lock-In for Planetary Exploration Sensors

IEEE SENSORS JOURNAL (p. 23367-23379) - 10/2022

10.1109/jsen.2022.3213423 Ver en origen

• EISSN 1558-1748
• ISSN 1530-437X

• UC3M

Online test of control flow errors: a new debug interface-based approach

IEEE TRANSACTIONS ON COMPUTERS (p. 1846-1855) - 6/2016

https://doi.org/10.1109/tc.2015.2456014 Ver en origen

• EISSN 1557-9956
• ISSN 0018-9340

• UC3M

On the use of embedded debug features for permanent and transient fault resilience in microprocessors

MICROPROCESSORS AND MICROSYSTEMS (p. 334-343) - 7/2012

https://doi.org/10.1016/j.micpro.2012.02.013 Ver en origen

• ISSN 0141-9331

• UC3M

HW/SW Co-Simulation System for Enhancing Hardware-in-the-Loop of Power Converter Digital Controllers

IEEE Journal of Emerging and Selected Topics in Power Electronics (p. 1779-1786) - 12/2017

https://doi.org/10.1109/jestpe.2017.2739710 Ver en origen

• EISSN 2168-6785
• ISSN 2168-6777

• UC3M

Fear recognition for women using a reduced set of physiological signals

Sensors (p. 1587) - 3/2021

Editor: MDPI AG

https://doi.org/10.3390/s21051587 Ver en origen

• EISSN 1424-8220
• ISSN 1424-3210
• ISSN/ISBN 1424-8220

• Dialnet
• UC3M

Fault Injection in Modern Microprocessors Using On-Chip Debugging Infrastructures

IEEE Transactions on Dependable and Secure Computing (p. 308-314) - 3/2011

https://doi.org/10.1109/tdsc.2010.50 Ver en origen

• EISSN 1941-0018
• ISSN 1545-5971

• UC3M

Evaluating the Effectiveness of a Software-Based Technique Under SEEs Using FPGA-Based Fault Injection Approach

JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS (p. 777-789) - 12/2012

https://doi.org/10.1007/s10836-012-5321-4 Ver en origen

• EISSN 1573-0727
• ISSN 0923-8174

• UC3M

Hardware Fault Injection. In: Soft Errors in Modern Electronic Systems

Soft Errors in Modern Electronic Systems (p. 141-166) - 11/2010

Editor: SPRINGER

https://doi.org/10.1007/978-1-4419-6993-4_6 Ver en origen

• ISBN 978-1-4419-6992-7

• UC3M

Fault-tolerance techniques for soft-core processors using the trace interface. In: FPGAs and parallel architectures for aerospace applications

FPGAs and parallel architectures for aerospace applications (p. 293-293-306) - 1/2016

Editor: SPRINGER

https://doi.org/10.1007/978-3-319-14352-1_19 Ver en origen

• ISBN 978-3-319-14351-4

• UC3M

Verifying hardening techniques for distributed electronic systems in critical applications

15th European Conference onRadiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on - 2015

https://doi.org/10.1109/radecs.2015.7365695 Ver en origen

• UC3M

Vector-Based Mismatch Shaping circuit for a low IF Multibit Sigma Delta ADC

33rd Conference on Design of Circuits and Integrated Systems (DCIS) - 2018

• ISBN 978-1-7281-0171-2

• UC3M

Using an FPGA-Based Fault Injection Technique to Evaluate Software Robustness Under SEEs: A Case Study

12th Latin American test Workshop (LATW 2011) - 2011

Editor: IEEE - THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, INC

• ISBN 978-1-4577-1489-4

• UC3M

Toward Fear Detection using Affect Recognition

XXXIV Conference on Design of Circuits and Integrated Systems, (DCIS 2019) (p. 1-4) - 2020

Editor: IEEE.THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, INC

https://doi.org/10.1109/dcis201949030.2019.8959852 Ver en origen

• ISBN 978-1-7281-5458-9

• UC3M

The Effects of Proton Irradiation on CoolRunner-II CPLD Technology

8th European Workshop on Radiation Effects on Components and Systems - 2008

• UC3M

System Dependability in Edge Computing Wearable Devices

DCIS 2020 - 35th Conference on Design of Circuits and Integrated Systems Virtual Conference<br/> (p. 1-6) - 2020

Editor: IEEE.THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, INC

https://doi.org/10.1109/dcis51330.2020.9268674 Ver en origen

• ISBN 978-1-7281-9132-4

• UC3M

Study on the Effect of Multiple Errors in Robust Systems Based on Critical Task Distribution

2011 12th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (p. 463-466) - 2011

Editor: IEEE - THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, INC

• ISBN 978-1-4577-0585-4

• UC3M

Smart Hardening for Round-based Encryption Algoritms: Application to Advanced Encryptijon Standard

14th IEEE International On-Line Testing Symposium (IOLTS) - 2008

• UC3M

Sensitivity Evaluation Method for Aerospace Digital Systems with Collaborative Hardening

Radiation Effects on Components and Systems Workshop (RADECS) (p. 1053-1058) - 2011

Editor: IEEE INTERNATIONAL LLC

https://doi.org/10.1109/tns.2011.2109397 Ver en origen

• ISBN 9781457705854

• UC3M

SEU Sensitivity of Robust Communication Protocols

18th International On-Line Testing Symposium (IOLTS 2012) (p. 188-193) - 2012

Editor: IEEE - THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, INC

• ISBN 978-1-4673-2082-5

• UC3M

Fear Classification using Affective Computing with Physiological Information and Smart-Wearables

Fecha de defensa: 13-05-2022

• UC3M