HW/SW Co-Simulation System for Enhancing Hardware-in-the-Loop of Power Converter Digital Controllers

IEEE Journal of Emerging and Selected Topics in Power Electronics (p. 1779-1786) - 12/2017

https://doi.org/10.1109/jestpe.2017.2739710 Ver en origen

• EISSN 2168-6785
• ISSN 2168-6777

• UC3M

Optimized Design and Implementation of Digital Lock-In for Planetary Exploration Sensors

IEEE SENSORS JOURNAL (p. 23367-23379) - 10/2022

10.1109/jsen.2022.3213423 Ver en origen

• EISSN 1558-1748
• ISSN 1530-437X

• UC3M

Soft Error Sensitivity Evaluation of Microprocessors by Multilevel Emulation-Based Fault Injection

IEEE TRANSACTIONS ON COMPUTERS (p. 313-322) - 3/2012

https://doi.org/10.1109/tc.2010.262 Ver en origen

• EISSN 1557-9956
• ISSN 0018-9340

• UC3M

Online test of control flow errors: a new debug interface-based approach

IEEE TRANSACTIONS ON COMPUTERS (p. 1846-1855) - 6/2016

https://doi.org/10.1109/tc.2015.2456014 Ver en origen

• EISSN 1557-9956
• ISSN 0018-9340

• UC3M

SET Emulation Considering Electrical Masking Effects

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 2015-2021) - 8/2009

https://doi.org/10.1109/tns.2009.2013346 Ver en origen

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

Analysis of SET effects in a PIC microprocessor for selective hardening

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 1078-1085) - 6/2011

https://doi.org/10.1109/tns.2010.2096433 Ver en origen

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

Analysis of Turbo Decoder Robustness Against SEU Effects

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 2184-2188) - 8/2009

https://doi.org/10.1109/tns.2009.2018270 Ver en origen

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

A New Hybrid Nonintrusive Error-Detection Technique Using Dual Control-Flow Monitoring

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 3236-3243) - 12/2014

https://doi.org/10.1109/tns.2014.2361953 Ver en origen

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

Efficient mitigation of data and control-flow errors in microprocessors

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 1590-1596) - 8/2014

https://doi.org/10.1109/tns.2014.2310492 Ver en origen

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

Fault Injection in Modern Microprocessors Using On-Chip Debugging Infrastructures

IEEE Transactions on Dependable and Secure Computing (p. 308-314) - 3/2011

https://doi.org/10.1109/tdsc.2010.50 Ver en origen

• EISSN 1941-0018
• ISSN 1545-5971

• UC3M

Fault-tolerance techniques for soft-core processors using the trace interface. In: FPGAs and parallel architectures for aerospace applications

FPGAs and parallel architectures for aerospace applications (p. 293-293-306) - 1/2016

Editor: SPRINGER

https://doi.org/10.1007/978-3-319-14352-1_19 Ver en origen

• ISBN 978-3-319-14351-4

• UC3M

Hardware Fault Injection. In: Soft Errors in Modern Electronic Systems

Soft Errors in Modern Electronic Systems (p. 141-166) - 11/2010

Editor: SPRINGER

https://doi.org/10.1007/978-1-4419-6993-4_6 Ver en origen

• ISBN 978-1-4419-6992-7

• UC3M

Using an FPGA-Based Fault Injection Technique to Evaluate Software Robustness Under SEEs: A Case Study

12th Latin American test Workshop (LATW 2011) - 2011

Editor: IEEE - THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, INC

• ISBN 978-1-4577-1489-4

• UC3M

Smart Hardening for Round-based Encryption Algoritms: Application to Advanced Encryptijon Standard

14th IEEE International On-Line Testing Symposium (IOLTS) - 2008

• UC3M

C-Element model for SET fault emulation

14th Radiation Effects on Components and Systems (RADECS 2013) (p. 1-4) - 2013

Editor: IEEE - THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, INC

https://doi.org/10.1109/radecs.2013.6937389 Ver en origen

• ISBN 978-1-4673-5057-0

• UC3M

Verifying hardening techniques for distributed electronic systems in critical applications

15th European Conference onRadiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on - 2015

https://doi.org/10.1109/radecs.2015.7365695 Ver en origen

• UC3M

Reducing SEU sensitivity in LIN networks: selective and collaborative hardening techniques

15th IEEE Latin-American Test Workshop (LATW2014) (p. 1-6) - 2014

Editor: IEEE Press

https://doi.org/10.1109/latw.2014.6841924 Ver en origen

• ISBN 978-1-4799-4711-9

• UC3M

SEU Sensitivity of Robust Communication Protocols

18th International On-Line Testing Symposium (IOLTS 2012) (p. 188-193) - 2012

Editor: IEEE - THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, INC

• ISBN 978-1-4673-2082-5

• UC3M

Exploiting the debug interface to support on-line test of control flow errors

19 th IEEE International On-line Testing Symposium (IOLTS 2013) (p. 98-103) - 2013

Editor: IEEE - THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, INC

https://doi.org/10.1109/iolts.2013.6604058 Ver en origen

• ISBN 978-1-4799-0664-2

• UC3M

Hardening of serial communication protocols for potentially critical systems in automotive applications: LIN bus

19 th IEEE International On-line Testing Symposium (IOLTS 2013) (p. 13-18) - 2013

Editor: IEEE - THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, INC

https://doi.org/10.1109/iolts.2013.6604044 Ver en origen

• ISBN 978-1-4799-0664-2

• UC3M

Study on the Effect of Multiple Errors in Robust Systems Based on Critical Task Distribution

2011 12th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (p. 463-466) - 2011

Editor: IEEE - THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, INC

• ISBN 978-1-4577-0585-4

• UC3M

A Recovery Mechanism for SET Protection Using Standard-Cells

2011 12th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (p. 128-131) - 2011

Editor: IEEE - THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, INC

• ISBN 978-1-4577-0585-4

• UC3M

Fear Classification using Affective Computing with Physiological Information and Smart-Wearables

Fecha de defensa: 13-05-2022

• UC3M