Reliability Evaluation of LU Decomposition on GPU-Accelerated System-on-Chip Under Proton Irradiation

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 1467-1474) - 7/2022

https://doi.org/10.1109/tns.2022.3155820 View at source

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

Hybrid Lockstep Technique for Soft Error Mitigation

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 1574-1581) - 7/2022

https://doi.org/10.1109/tns.2022.3149867 View at source

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

Analyzing Scaled Reduced Precision Redundancy for Error Mitigation under Proton Irradiation

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 1485-1491) - 7/2022

https://doi.org/10.1109/tns.2022.3147599 View at source

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

Comparison of parallel implementation strategies in GPU-accelerated System-on-Chip under proton irradiation

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 444-452) - 3/2022

10.1109/tns.2021.3128722 View at source

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

Analyzing Reduced Precision Triple Modular Redundancy under Proton Irradiation

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 470-477) - 3/2022

https://doi.org/10.1109/tns.2022.3152088 View at source

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

Reduced resolution redundancy: A novel approximate error mitigation technique

IEEE Access (p. 20643-20651) - 2/2022

https://doi.org/10.1109/access.2022.3152202 View at source

• EISSN 2169-3536

• UC3M

Microprocessor error diagnosis by trace monitoring under laser testing

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 1651-1659) - 8/2021

https://doi.org/10.1109/tns.2021.3067554 View at source

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

Error sensitivity study of FFT architectures implemented in FPGA

MICROELECTRONICS RELIABILITY (p. 1-5) - 11/2021

https://doi.org/10.1016/j.microrel.2021.114298 View at source

• ISSN 0026-2714

• UC3M

Radiation Testing of a Multiprocessor Macrosynchronized Lockstep Architecture With FreeRTOS

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (p. 462-469) - 11/2021

https://doi.org/10.1109/tns.2021.3129164 View at source

• EISSN 1558-1578
• ISSN 0018-9499

• UC3M

Using Approximate Circuits Against Hardware Trojans

IEEE Design & Test - 10/2021

10.1109/mdat.2021.3117741 View at source

• ISSN 2168-2356

• UC3M

Fault-tolerance techniques for soft-core processors using the trace interface. In: FPGAs and parallel architectures for aerospace applications

FPGAs and parallel architectures for aerospace applications (p. 293-293-306) - 1/2016

Editor: SPRINGER

https://doi.org/10.1007/978-3-319-14352-1_19 View at source

• ISBN 978-3-319-14351-4

• UC3M

Hardware Fault Injection. In: Soft Errors in Modern Electronic Systems

Soft Errors in Modern Electronic Systems (p. 141-166) - 11/2010

Editor: SPRINGER

https://doi.org/10.1007/978-1-4419-6993-4_6 View at source

• ISBN 978-1-4419-6992-7

• UC3M

High complexity reliable Space applications in commercial microprocessors

33rd European Symposium on Reliability of Electron Devices Failure Physics and Analysis (ESREF) 2022 (p. 1-5) - 2022

Editor: ELSEVIER, LTD.

https://doi.org/10.1016/j.microrel.2022.114679 View at source

• ISBN 0026-2714

• UC3M

Comparative of proton radiation data for 28 nm Zynq-7000 SoC

Radiation and its Effects on Components and Systems Conference (RADECS) 2022 - 2022

• UC3M

Impact of atmospheric and space radiation on sensitive electronic devices

27th IEEE European Test Symposium (ETS 2022) - 2022

Editor: IEEE.THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, INC

10.1109/ets54262.2022.9810454 View at source

• ISBN 978-1-6654-6706-3

• UC3M

Evaluation of a multiprocessor system hardened with macro-synchronized lockstep with FreeRTOS OS using proton irradiation

IEEE Nuclear & Space Radiation Effects Conference (NSREC 2021) - 2021

• UC3M

Evaluating Fundamental Matrix Operations on Multi-core System-on-Chip

XXXVI Conference on Design of Circuits and Integrated Systems (DCIS) 2021 - 2021

• UC3M

Evaluating reliability through soft error triggered exceptions at ARM Cortex-A9 microprocessor

32th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2021) (p. 1-6) - 2021

Editor: ELSEVIER, LTD.

https://doi.org/10.1016/j.microrel.2021.114323 View at source

• ISBN 0026-2714

• UC3M

Evaluating the soft error sensitivity of a GPU-based SoC for matrix multiplication

31th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2020) (p. 1-6) - 2020

Editor: ELSEVIER, LTD.

https://doi.org/10.1016/j.microrel.2020.113856 View at source

• ISBN 0026-2714

• UC3M

Fault Injection and Formal Verification Methodologies

15th International School on the Effects of Radiation on Embedded Systems for Space Applications (SERESSA 2019) - 2019

• UC3M

Radiation Effects and Mitigation Techniques in FPGAs: the Complexity Challenge (Short Course Program "Prepare for the next decade")

Europeans Conference on Radiation and its effects on components & systems (RADECS, 2019) - 2019

• UC3M

Approximate TMR for selective error mitigation in FPGAs based on testability analysis

2018 NASA/ESA Conference on Adaptive Hardware and Systems (2018 AHS) (p. 112-119) - 2018

Editor: IEEE Computer Society.

https://doi.org/10.1109/ahs.2018.8541485 View at source

• ISBN 978-1-5386-7753-7

• UC3M

Contribución al reconocimiento de huellas dactilares mediante técnicas de correlación y arquitecturas hardware para el aumento de prestaciones

Reading date: 08-05-2009

• UC3M

Técnicas<br/> Híbridas de Tolerancia a Fallos en Microprocesadores

Reading date: 15-11-2017

• UC3M

Error Detection and Diagnosis for System-on-Chip in Space Applications

Reading date: 20-06-2022

• UC3M

Transient<br/> error mitigation by means of approximate logic circuits

Reading date: 03-11-2017

• UC3M

Dispositivo y procedimiento para la identificación unívoca de un circuito integrado

3/5/2019

Date filed: 31-03-2017

Date issued: 03-05-2019

• UC3M